A model for the yield strength of a thin polycrystalline film
Acta Physica Sinica
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Acta Phys. Sin.  2003, Vol. 52 Issue (5): 1234-1239    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
A model for the yield strength of a thin polycrystalline film
Zhang Mei-Rong1, Zhang Jian-Min2, Xu Ke-Wei3
(1)陕西师范大学图书馆,西安 710062; (2)陕西师范大学物理学与信息技术学院,西安 710062;西安交通大学金属材料强度国家重点实验室,西安 710049; (3)西安交通大学金属材料强度国家重点实验室,西安 710049
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