| [1] |
Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De. Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica,
2013, 62(4): 048801.
doi: 10.7498/aps.62.048801
|
| [2] |
Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong. Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica,
2013, 62(14): 140701.
doi: 10.7498/aps.62.140701
|
| [3] |
Xu Xiao-Ming, Miao Wei, Tao Kun. Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica,
2011, 60(8): 086101.
doi: 10.7498/aps.60.086101
|
| [4] |
Zhang Yan-Hui, Chen Ping-Ping, Li Tian-Xin, Yin Hao. InNSb single crystal films prepared on GaAs (001) substrates by molecular beam epitaxy. Acta Physica Sinica,
2010, 59(11): 8026-8030.
doi: 10.7498/aps.59.8026
|
| [5] |
Tang Jun, Liu Zhong-Liang, Ren Peng, Yao Tao, Yan Wen-Sheng, Xu Peng-Shou, Wei Shi-Qiang. Structural characterization of Mn doped SiC magnetic thin films. Acta Physica Sinica,
2010, 59(7): 4774-4780.
doi: 10.7498/aps.59.4774
|
| [6] |
Su Hai-Qiao, Xue Shu-Wen, Chen Meng, Li Zhi-Jie, Yuan Zhao-Lin, Fu Yu-Jun, Zu Xiao-Tao. Effects of Ti ion implantation and post-thermal annealing on the structural and optical properties of ZnS films. Acta Physica Sinica,
2009, 58(10): 7108-7113.
doi: 10.7498/aps.58.7108
|
| [7] |
Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica,
2009, 58(4): 2742-2745.
doi: 10.7498/aps.58.2742
|
| [8] |
Zhang Li-Ping, Zhang Jian-Jun, Zhang Xin, Shang Ze-Ren, Hu Zeng-Xin, Zhang Ya-Ping, Geng Xin-Hua, Zhao Ying. Investigation of microcrystalline silicon germanium prepared by hydrogen and helium gas mixture diluted VHFPA-RTCVD. Acta Physica Sinica,
2008, 57(11): 7338-7343.
doi: 10.7498/aps.57.7338
|
| [9] |
Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng. Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica,
2008, 57(11): 7119-7125.
doi: 10.7498/aps.57.7119
|
| [10] |
. Properties of Co nano-films deposited on monocrystalline silicon surface by ion beam sputtering. Acta Physica Sinica,
2007, 56(12): 7158-7164.
doi: 10.7498/aps.56.7158
|
| [11] |
Xie Zi-Li, Zhang Rong, Xiu Xiang-Qian, Liu Bin, Zhu Shun-Ming, Zhao Hong, Pu Lin, Han Ping, Jiang Ruo-Lian, Shi Yi, Zheng You-Dou. The oxidation characteristics of InN films. Acta Physica Sinica,
2007, 56(2): 1032-1035.
doi: 10.7498/aps.56.1032
|
| [12] |
Yan Feng-Ping, Zheng Kai, Wang Lin, Li Yi-Fan, Gong Tao-Rong, Jian Shui-Sheng, K. Ogata, K. Koike, S. Sasa, M. Inoue, M. Yano. Measurement of thickness and refractive index of Zn1-xMgxO film grown on sapphire substrate by molecular beam epitaxy. Acta Physica Sinica,
2007, 56(7): 4127-4131.
doi: 10.7498/aps.56.4127
|
| [13] |
Liu Guo-Han, Ding Yi, Zhu Xiu-Hong, Chen Guang-Hua, He De-Yan. Preparation and characterization of hydrogenated microcrystalline silicon films by HW-MWECR-CVD. Acta Physica Sinica,
2006, 55(11): 6147-6151.
doi: 10.7498/aps.55.6147
|
| [14] |
Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia. New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica,
2006, 55(3): 1325-1335.
doi: 10.7498/aps.55.1325
|
| [15] |
Zhou Qing-Chun. Emission spectrum of a cascade three-level atom with orthogonal dipoles interacting with a single-mode field. Acta Physica Sinica,
2006, 55(9): 4618-4623.
doi: 10.7498/aps.55.4618
|
| [16] |
Yan Feng-Ping, Jian Shui-Sheng, Ogata K., Koike K., Sasa S., Inoue M., Yano M.. Measurement of Mg content in Zn1－xMgxO films by inductively coupled plasma method. Acta Physica Sinica,
2006, 55(6): 3013-3017.
doi: 10.7498/aps.55.3013
|
| [17] |
Feng Qian, Wang Feng-Xiang, Hao Yue. Effect of Mg doping on properties of AlGaN films. Acta Physica Sinica,
2004, 53(10): 3587-3590.
doi: 10.7498/aps.53.3587
|
| [18] |
Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma. X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica,
2004, 53(10): 3510-3514.
doi: 10.7498/aps.53.3510
|
| [19] |
Chen Dun-Jun, Shen Bo, Zhang Kai-Xiao, Deng Yong-Zhen, Fan Jie, Zhang Rong, Shi Yi, Zheng You-Dou. Structural properties of GaN1-xPx films. Acta Physica Sinica,
2003, 52(7): 1788-1791.
doi: 10.7498/aps.52.1788
|
| [20] |
JIN ZHAN, ZHANG JIE. STUDY OF ALUMINUM EMISSION SPECTRA IN ASTROPHYSICAL PLASMAS. Acta Physica Sinica,
2001, 50(2): 365-368.
doi: 10.7498/aps.50.365
|
下载:
