Prediction of failure time for floating gate ROM devices at low dose rate in space radiation environment
Acta Physica Sinica
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Acta Phys. Sin.  2004, Vol. 53 Issue (9): 3125-3129    
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
Prediction of failure time for floating gate ROM devices at low dose rate in space radiation environment
He Bao-Ping, Guo Hong-Xia, Gong Jian-Cheng, Wang Gui-Zhen, Luo Yin-Hong, Li Yong-Hong
西北核技术研究所,西安 710024
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