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CN 11-1958/O4
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Other articles related with "6180E":
3538 Yu Jun, Zhou Peng, Zhao Heng-Yu, Wu Feng, Xia Hai-Ping, Su Liang-Bi, Xu Jun
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2827 Zhou Peng, Su Liang-Bi, Li Hong-Jun, Yu Jun, Zheng Li-He, Yang Qiu-Hong, Xu Jun
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1638 Meng Xian-Zhu, Wang Ming-Hong, Ren Zhong-Min
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1985 He Bao-Ping, Yao Zhi-Bin
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1258 Jin Yu-Zhe, Hu Yi-Pei, Zeng Xiang-Hua, Yang Yi-Jun
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    Acta Physica Sinica   2010 Vol.59 (2): 1258-1262 [Abstract] (3603) [HTML 0 KB] [PDF 665 KB] (968)
447 Yang Tong-Zai, Luo Shun-Zhong
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    Acta Physica Sinica   2010 Vol.59 (1): 447-452 [Abstract] (3482) [HTML 0 KB] [PDF 329 KB] (907)
4090 Chen Wei-Hua, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin, He Liang, Zhang Tian-Fu, Zhang Xue
  A model considering the ionizing radiation effects in MOS structure
    Acta Physica Sinica   2009 Vol.58 (6): 4090-4095 [Abstract] (3383) [HTML 0 KB] [PDF 201 KB] (1312)
1161 Gu Wen-Ping, Zhang Jin-Cheng, Wang Chong, Feng Qian, Ma Xiao-Hua, Hao Yue
  Influence of 60Co γ-ray irradiation on AlGaN/GaN high electron mobility transistors
    Acta Physica Sinica   2009 Vol.58 (2): 1161-1165 [Abstract] (3613) [HTML 0 KB] [PDF 237 KB] (1236)
7088 Qiao Hui, Liao Yi, Hu Wei-Da, Deng Yi, Yuan Yong-Gang, Zhang Qin-Yao, Li Xiang-Yang, Gong Hai-Mei
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5869 Yang Li-Xia, Du Lei, Bao Jun-Lin, Zhuang Yi-Qi, Chen Xiao-Dong, Li Qun-Wei, Zhang Ying, Zhao Zhi-Gang, He Liang
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5205 Peng Shao-Quan, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin, He Liang, Chen Wei-Hua
  Radiation degradation model of metal-oxide-semiconductor field effect transistor based on pre-irradiation 1/f noise
    Acta Physica Sinica   2008 Vol.57 (8): 5205-5211 [Abstract] (3401) [HTML 0 KB] [PDF 262 KB] (1025)
4056 Kong De-Jun, Zhang Yong-Kang, Chen Zhi-Gang, Lu Jin-Zhong, Feng Ai-Xin, Ren Xu-Dong, Ge Tao
  Experimental study of residual stress of galvanized passive film based on XRD
    Acta Physica Sinica   2007 Vol.56 (7): 4056-4061 [Abstract] (3744) [HTML 0 KB] [PDF 226 KB] (1230)
3400 Li Rui-Min, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin
  A 1/f noise based research of radiation induced interface trap buildup process
    Acta Physica Sinica   2007 Vol.56 (6): 3400-3406 [Abstract] (3861) [HTML 0 KB] [PDF 245 KB] (1140)
6008 Zhang Yong-Kang, Kong De-Jun, Feng Ai-Xin, Lu Jin-Zhong, Ge Tao
  Study on the detection of interfacial bonding strength of coatings (Ⅱ): detecting system of bonding strength
    Acta Physica Sinica   2006 Vol.55 (11): 6008-6012 [Abstract] (3734) [HTML 0 KB] [PDF 260 KB] (1903)
3546 He Bao-Ping, Chen Wei, Wang Gui-Zhen
  A comparison of ionizing radiation damage in CMOS devices from 60Co Gamma rays, electrons and protons
    Acta Physica Sinica   2006 Vol.55 (7): 3546-3551 [Abstract] (3964) [HTML 0 KB] [PDF 399 KB] (1286)
2897 Zhang Yong-Kang, Kong De-Jun, Feng Ai-Xin, Lu Jin-Zhong, Zhang Lei-Hong, Ge Tao
  Study on the determination of interfacial binding strength of coatings (Ⅰ): theorctical analysis of stress in thin film binding interface
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890 HU KAI-SHENG, LI ZONG-XIANG, NING DING, LI HAO, ZHOU JIAN-PING, LIU WEI-MIN
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188 He Bao-Ping, Wang Gui-Zhen, Zhou Hui, Gong Jian-Cheng, Luo Yin-Hong, Jiang Jing-He
  Predicting NMOS device radiation response at different dose rates in γ-ray environment
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3125 He Bao-Ping, Guo Hong-Xia, Gong Jian-Cheng, Wang Gui-Zhen, Luo Yin-Hong, Li Yong-Hong
  Prediction of failure time for floating gate ROM devices at low dose rate in space radiation environment
    Acta Physica Sinica   2004 Vol.53 (9): 3125-3129 [Abstract] (3034) [HTML 0 KB] [PDF 196 KB] (869)
406 Yang Hai-Liang, Qiu Ai-Ci, Zhang Jia-Sheng, He Xiao-Ping, Sun Jian-Feng, Peng Jian-Chang, Tang Jun-Ping, Ren Shu-Qing, Ouyang Xiao-Ping, Zhang Guo-Guang, Huang Jian-Jun, Yang Li, Wang Hai-Yang, Li Hon
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2239 He Bao-Ping, Wang Gui-Zhen, Gong Jian-Cheng, Luo Yin-Hong, Li Yong-Hong
  Prediction on the characteristics of isothermal annealing by using isochronal an nealing data
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2434 ZHANG TING-QING, LIU CHUAN-YANG, LIU JIA-LU, WANG JIAN-PING, HUANG ZHI, XU NA-JUN, HE BAO-PING, PENG HONG-LUN, YAO YU-JUAN
  RADIATION EFFECTS OF MOS DEVICE AT LOW DOSE RATE AND LOW TEMPERATURE
    Acta Physica Sinica   2001 Vol.50 (12): 2434-2438 [Abstract] (2993) [HTML 0 KB] [PDF 167 KB] (1348)
1331 WANG JIAN-PING, XU NA-JUN, ZHANG TING-QING, TANG HUA-LIAN, LIU JIA-LU, LIU CHUAN -YANG, YAO YU-JUAN, PENG HONG-LUN, HE BAO-PING, ZHANG ZHENG-XUAN
  TEMPERATURE EFFECTS OF γ-IRRADIATED METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT-TRAN SISTOR
    Acta Physica Sinica   2000 Vol.49 (7): 1331-1334 [Abstract] (2985) [HTML 0 KB] [PDF 180 KB] (1148)
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