Acta Physica Sinica
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2005, Vol. 54(12): 5814-5819    DOI: 10.7498/aps.54.5814
Theoretical research on critical thickness of HgCdTe epitaxial layers
Wang Qing-Xue, Yang Jian-Rong, Wei Yan-Feng
中国科学院上海技术物理研究所,上海 200083
Received 2005-01-27  Revised 2005-03-28
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