Acta Physica Sinica
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2012, Vol. 61(17): 170304-170304    DOI: 10.7498/aps.61.170304
Fabrication and characterization of single Nb/NbxSi1-x/Nb Josephson junction for voltage standard
Cao Wen-Hui1, Li Jin-Jin1, Zhong Qing1, Guo Xiao-Wei2, He Qing1, Chi Zong-Tao2
1. National Institute of Metrology, Beijing 100013, China;
2. Qingdao University, Qingdao 266003, China
Received 2012-05-19  Revised 2012-06-11
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