Acta Physica Sinica
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2004, Vol. 53(9): 3239-3244    DOI: 10.7498/aps.53.3239
Junction capacitance models of SiGe HBT
Lü Yi, Zhang He-Ming, Dai Xian-Ying, Hu Hui-Yong, Shu Bin
西安电子科技大学微电子所,西安 710071
Received 2003-10-13  Revised 2004-01-16
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