Abstract: In this article a method incorporating the information yielded by high resolution electron micrographs and the corresponding electron diffraction patterns is proposed for the determination of crystal structures. Using this method it is possible to solve the problem of extracting structure amplitude moduli from electron diffraction data and also to solve the phase problem that commonly occurs in diffraction analysis. The resolution of the structure image so obtained may be higher than that of the original electron micrographs and may approach the diffraction limit.