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物理学报. 1977, 26(5): 193-198.
doi: 10.7498/aps.26.193.
用高分辨电子显微镜测定晶体结构
- 收稿日期: 1975-12-31
- 刊出日期: 2005-08-01
摘要: 本文提出一个把高分辨电子显微图和相应的选区电子衍射图结合起来以测定晶体结构的方法。此法可解决从电子衍射数据求解结构振幅绝对值的问题,亦可解决各种衍射分析所共有的相角问题。所得结构图像的分辨本领将优于电子显微图,而有可能接近于衍射分辨极限。
English Abstract
DETERMINATION OF CRYSTAL STRUCTURES BY HIGH RESOLUTION ELECTRON MICROSCOPY
- Received Date:
31 December 1975
- Published Online:
01 August 2005
Abstract: In this article a method incorporating the information yielded by high resolution electron micrographs and the corresponding electron diffraction patterns is proposed for the determination of crystal structures. Using this method it is possible to solve the problem of extracting structure amplitude moduli from electron diffraction data and also to solve the phase problem that commonly occurs in diffraction analysis. The resolution of the structure image so obtained may be higher than that of the original electron micrographs and may approach the diffraction limit.
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