引用本文: |
Citation: |
计量
- 文章访问数: 3216
- PDF下载量: 632
- 被引次数: 0
引用本文: |
Citation: |
摘要: 利用原位X射线衍射技术得到非晶调制多层膜Nb/Si中的互扩散系数与退火温度的关系,调制周期L=3.2nm的非晶调制多层膜是用粒子溅射方法制备的.温度范围为423—523K的有效互扩散系数通过原位测量多层膜的一级调制峰强度与退火温度之间的关系而得到.利用缺陷陷阱延迟扩散机制解释了所得到的扩散系数与退火温度的关系.建立了可以解释较小前置系数的模型
Abstract: The amorphous Nb/Si multilayers were prepared for the interdiffusion study. The temperature dependent effective interdiffusion at low temperature in amorphous Nb/Si multilayer was obtained using in-situ XRD technique. The smaller pre-exponential factor for diffusion coefficient in amorphous Nb/Si multilayer is explained by the trap-retarded diffusion mechanism. In this model, the atomic vibration frequency v is substituted by the average characteristic atomic vibration frequency v because of the presence of defect traps.