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中国物理学会期刊

Yb掺杂C60薄膜的x射线光电子能谱研究

CSTR: 32037.14.aps.53.915

X-ray photoemission studies of Yb intercalated C60 thin film

CSTR: 32037.14.aps.53.915
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  • 在超高真空系统中制备了C60的Yb填隙化合物薄膜.用x射线光电子能谱研究了Yb和C60结合过程中C 1s,Yb 4f和Yb 4d的变化.利用Yb 4f和C 1s的谱峰强度确定出相纯样品的化学组分接近Yb2.75C60,这一结果与晶体x射线衍射结果一致.Yb 4f和Yb 4d的峰形与峰位表明化合物中Yb的价态为Yb2+.相纯样品(Yb2.75C60)的C

     

    Yb-intercalated C60 thin film was prepared in a ultra-high-vacuum system. The binding energies of C 1s, Yb 4f and Yb 4d during the compound formation were studied by x-ray photoemission technique. The stoichiometry of the phase-pure sample was determined by the peak intensities of Yb 4f and C 1s. The result turned to be very near to that for Yb2.75C60 that was first determined for bulk-phase sample by x-ray diffraction measurement. The positions and intensities of the Yb 4f and Yb 4d peaks revealed the charge state of Yb2+ in Yb2.75C60. The C 1s core level for the phase-pure sample shifted towards lower binding energy by ≈0.5 eV relative to C60, which exhibited that some Yb 6s electrons transferred from Yb to the lowest unoccupied molecular orbital band of C60. The shift and the FWHM of C 1s x-ray photoemission spectroscopic peak can be used as sample characterization in future researches on Yb/C60 compounds.

     

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