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中国物理学会期刊

射频功率对类金刚石薄膜结构和性能的影响

CSTR: 32037.14.aps.54.1885

Effect of RF power on the structure and properties of diamond-like carbon films

CSTR: 32037.14.aps.54.1885
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  • 利用直流-射频-等离子体增强化学气相沉积技术在单晶硅表面制备了类金刚石薄膜,采用原子力显微镜、Raman光谱、x射线光电子能谱、红外光谱和纳米压痕仪考察了射频功率对类金刚石薄膜表面形貌、微观结构、硬度和弹性模量的影响.结果表明,制备的薄膜具有典型的含H类金刚石结构特征,薄膜致密均匀,表面粗糙度很小.随着射频功率的升高,薄膜中成键H的含量逐渐降低,而薄膜的sp33含量、硬度以及弹性模量先升高, 后降低,并在射频功率为100W时达到最大.

     

    Diamond-like carbon (DLC) films were deposited on Si substrates by a dual direct current and radio frequency plasma-enhanced chemical vapor deposition (DC-RF-PECVD) technique. The effect of RF power on the surface morphology, micros tructure, hardness and Young's modulus of DLC films was investigated by atomic f orce microscopy, Raman spectroscopy, x-ray photoelectron spectrometry, infrared spectroscopy and nano-indentation. The films produced by DC-RF-PECVD have typical hydrogenated diamond-like characteristics, and the surface of the film s was smooth and compact.With the increase of RF power the bonded hydrogen conte nt in the films decreased while the sp33 content, hardness and Youn g's modulus of the DLC films reached the maxima at an RF power of 100W and then they decr eased with further increase of the RF power.

     

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