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中国物理学会期刊

X射线二极管时间特性研究

CSTR: 32037.14.aps.55.68

Research on time characteristics of soft X-ray diode

CSTR: 32037.14.aps.55.68
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  • 研究X射线二极管(XRD)时间特性.XRD 是构成软X射线能谱仪的主要部件,它用于激光等离子体发射软X射线谱测量.实验利用激光聚变研究中心的200TW激光器(激光能量~6J,脉冲宽度~30fs)打金箔靶产生的X射线发射谱,用滤片(Al)-XRD探测系统测量,探测信号由高频电缆(SUJ-50-10)传输和宽带示波器(TDS694C和TDS6604B)记录.实验数据进行了线性拟合和比对分析.

     

    In this paper the time characteristics of soft X-ray diode (XRD) is studied. XRD is the importance component of soft X-ray spectrometer,which measures the soft X-ray spectrum emited by laser-plasma.The experiment utilizes the 200TW laser facility with energy ~6J and pulse width ~30fs at the Laser Fusion Research Center of CAEP.The Au foil target irradiated by laser pulse produced X-ray emission, the filter(Al)-XRD system measures the X-ray signal.The high frequency cable (SUJ-50) transmits the electrical signal, a broad band oscillograph (TDS694C and TDS6604B) registers the signal.Linearity fit and comparison analysis of experimental data are performed.

     

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