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中国物理学会期刊

电子辐照下聚合物介质深层充电现象研究

CSTR: 32037.14.aps.58.1205

Phenomenon of deep charging in polymer under electron beam irradiation

CSTR: 32037.14.aps.58.1205
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  • 空间辐射环境中,聚合物介质的深层充放电效应是威胁航天器安全的重要因素之一.文中在Chudleigh和von Berlepsch所发展的电位衰减模型基础上引入传输电流项,考虑了电子入射引起的感应电导率和感应电场的影响,提出了新的分析研究介质材料深层充电规律和特征的模型.通过该模型,分析了不同辐射条件下介质的表面电位、内部电荷与电场分布的变化,并设计实验及援引其他实验数据对模型分析结果进行验证.分析和实验结果表明,聚合物介质在深层充电过程中的平衡电位随着入射电子束流强度和介质电阻率的增加而增大,决定深层充电平

     

    Deep charging and discharging effect is one of the key factors threatening the satellites safety in space environment. We develop a new model and simulate the surface potential evolution, internal charge distribution and electrical field distribution in the polymer charged by electron beam of different intensities. The results are compared with experimental results, which show that the polymer′s surface potential increases with electron beam intensity and its resistance, and the time to reach charging equilibrium is determined mainly by the polymer′s resistance.

     

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