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摘要: 以往对干涉成像光谱仪的研究通常仅限于对光的干涉特性的利用，即由目标干涉图得到其光谱图，而忽略了其丰富的偏振信息.为了在利用光的干涉特性的同时还充分利用光的偏振特性，在原有偏振干涉成像光谱仪的基础上，结合现有的干涉成像光谱技术与偏振探测原理，提出了一种利用现有偏振干涉成像光谱仪获取探测目标的偏振参数(偏振度、偏振方位角等)的新方法，并对其精度误差进行了理论分析，证明了其不但具有较高的稳定性而且具有极高的测量精度.因此，若把以往的偏振干涉成像光谱仪看作是照相机与光谱仪功能的结合，则现在可以将之理解为成像仪、光
Abstract: It is a common method to use the interferential characteristics of light to detect the object in the polarization interference imaging spectrometer system，but the polarized characteristics are usually ignored. In this paper, an advanced way, which combines the basic theories of polarization interference imaging spectroscopy and polarization measurement technology, is studied and used to detect the polarization parameters (e.g. degree of polarization, azimuth angle of polarization), and the error is analyzed, which proves that the system is very stable and precise in theory. Now the polarization interference imaging spectrometer can be used not only as cameras and interferometers but also as polaristrobometers, because the polarized characteristics of the light are made good use of to analyse and distinguish the object in a new way.
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