搜索

x
中国物理学会期刊

反射式负电子亲和势GaN光电阴极量子效率衰减机理研究

CSTR: 32037.14.aps.59.2855

Quantum efficiency decay mechanism for reflection-mode negative electron affinity GaN photocathode

CSTR: 32037.14.aps.59.2855
PDF
导出引用
  • 针对反射式负电子亲和势(NEA) GaN光电阴极量子效率的衰减以及不同波段对应量子效率衰减速度的不同,参照国外给出的NEA GaN光电阴极在反射模式下量子效率曲线随时间的衰减变化情况,利用GaN光电阴极铯氧激活后的表面模型[GaN(Mg):Cs]:O-Cs,结合量子效率衰减过程中表面势垒的变化,研究了反射式NEA GaN光电阴极量子效率的衰减机理. 有效偶极子数量的减小是造成量子效率降低的根本原因,表面I,II势垒形状的变化造成了不同波段对应的量子效率下降速度的不同.

     

    Aimming at the decay tendency of reflection-mode negative electron affinity (NEA) GaN photocathode and the different decay speeds of quantum efficiency corresponding to the different wave bands, and referring to the decay tendency of quantum efficiency curve provided by foreign authors for reflection-mode NEA GaN photocathode, the quantum efficiency decay mechanism for reflection-mode NEA GaN photocathode was studied. The surface model [GaN (Mg) : Cs]: O-Cs for GaN photocathode after being activated with cesium and oxygen was used. And the change of surface barrier in the decay course of quantum efficiency was considered. The reduction of the effective dipole quantity is the basic reason causing quantum efficiency reduction. And it is the change of surface I, II barrier shape that causes the difference of dropping speeds of quantum efficiencies corresponding to different wave bands.

     

    目录

    /

    返回文章
    返回