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中国物理学会期刊

层状晶体层错的会聚束电子衍射研究

CSTR: 32037.14.aps.35.274

CONVERGENT-BEAM ELECTRON DIFFRACTION STUDY OF TRANSVERSE BASAL STACKING FAULTS IN LAYER STRUCTURES

CSTR: 32037.14.aps.35.274
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  • 用会聚束电子衍射得到了石墨和辉钼矿的底面横向层错的带轴图样。带轴图样显示了层错引起的变化,对称性降低和部分衍射分裂,本文首先指出衍射分裂或不分裂可以用晶体缺陷衍射衬度理论来解释,这对应于缺陷的可见和不可见,这结果对缺陷的研究有普遍性意义。这方法为研究晶体缺陷提供了强有力的手段。

     

    Convergent-beam electron diffraction zone-axis patterns have been obtained from transverse basal stacking faults in graphite and molybdenite. These patterns show a reduced symmetry and split reflections. The splitting and unsplitting of the reflections correspond to the visibility and invisibility of the stacking faults in the theory of diffraction contrast of imperfect crystals. This analysis can be extended to zone-axis patterns obtained from other crystal defects.

     

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