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建立了含有裂纹或气泡的高斯型修复坑的3维模型, 用3维时域有限差分方法研究了熔石英后表面该类缺陷对355 nm入射激光的近场调制. 研究表明, 裂纹的调制明显大于气泡或者高斯坑本身, 因此为了抑制修复元件的初始损伤, 应尽量避免任何未修复的裂纹存在, 尤其是与入射光呈夹角约25°的裂纹, 同时应避免尺寸大于5 λ 的气泡存在. 当裂纹或气泡位于近表面层3 λ 以内且靠近修复坑环边缘时, 对场的调制最明显. 随着侧移的增加, 近表面区缺陷诱导场叠加, 强点总数涨落较大且易形成极大峰值, 特别是含有裂纹的情形; 远表面区强点总数逐渐增大并趋于稳定. 随着嵌深的增加, 强点的数目大体呈减弱趋势, 当嵌深大于3 λ 时, 逐渐趋于平缓振荡. 如果裂纹或气泡位于坑点正下方几个波长内, 激光辐照下其效果相当于延长了高斯坑的深度.
[1] Hrubesh L W, Brusasco R M, Grundler W, Norton M A, Donohue E E, Molander W A, Thompson S L, Strodtbeck S R, Whitman P K, Shirk M D, Wegner P J, Nostrand M C, Burnham A K 2003 Proc. SPIE 4932 180
[2] Hrubesh L W, Norton M A, Molander W A, Donohue E E, Maricle S M, Penetrante B M, Brusasco R M, Grundler W, Butler J A, Carr J W, Hill R M, Summers L J, Feit M D, Rubenchik A, Key M H, Wegner P J, Burnham A K, Hackel L A, Kozlowski M R 2002 Proc. SPIE 4679 23
[3] DeFord J F, Kozlowski M R 1993 Proc. SPIE 1848 455
[4] Brusasco R M, Penetrante B M, Butler J A, Hrubesh L W 2002 Proc. SPIE 4679 40
[5] During A, Lamaignére L, Bouchut P, Piombini H 2004 Proc. SPIE 5467 177
[6] Ge D B, Yan Y B 2005 FDTD method for Electromagnetic Waves (Xi'an: Xidian University Press) (in Chinese) [葛德彪, 闫玉波 2005 电磁波时域有限差分方法 (西安: 西安电子科技大学出版社)]
[7] Li L, Xiang X, Zu X T, Wang H J, Yuan X D, Jiang X D, Zheng W G, Dai W 2011 Chin. Phys. B 20 074209
[8] Dai W, Xiang X, Jiang Y, Wang H J, Li X B, Yuan X D, Zheng W G, Lv H B, Zu X T 2011 Opt. Laser Eng. 49 273
[9] Xiang X, Zheng W G, Yuan X D, Dai W Jiang Y, Li X B, Wang H J, Lv H B, Zu X T 2011 Chin. Phys. B 20 044208
[10] During A, Bouchut P, Coutard J G, Leymarie C, Bercegol H 2006 Proc. SPIE 6403 640323
[11] Tomozawa M, Li C Y, Gross T M 2010 Journal of Non-Crystalline Solids 356 1194
[12] Guss G, Bass I, Draggoo V, Hackel R, Payne S, Lancaster M, Mak P 2006 Proc. SPIE 6403 64030M
[13] Hua J R, Li L, Xiang X, Zu X T 2011 Acta. Phys. Sin. 60 044206 (in Chinese) [花金荣, 李莉, 向霞, 祖小涛 2011 物理学报 60 044206]
[14] Hua J R, Jiang X D, Zu X T 2010 High Power Laser and Part. Beams 22 1441 (in Chinese) [花金荣, 蒋晓东, 祖小涛 2010 强激光与粒子束 22 1441]
[15] Brusasco R M, Penetrante B M, Butler J A, Maricle S M, Peterson J E 2002 Proc. SPIE 4679 34
[16] Qiu S G, Wolfe J E, Monterrosa A M, Feit M D, Pistor T V, Stolz C J 2009 Proc. SPIE 7504 75040M
[17] Gallais L, Cormont P, Rullier J L 2009 Opt. Express 17 23488
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[1] Hrubesh L W, Brusasco R M, Grundler W, Norton M A, Donohue E E, Molander W A, Thompson S L, Strodtbeck S R, Whitman P K, Shirk M D, Wegner P J, Nostrand M C, Burnham A K 2003 Proc. SPIE 4932 180
[2] Hrubesh L W, Norton M A, Molander W A, Donohue E E, Maricle S M, Penetrante B M, Brusasco R M, Grundler W, Butler J A, Carr J W, Hill R M, Summers L J, Feit M D, Rubenchik A, Key M H, Wegner P J, Burnham A K, Hackel L A, Kozlowski M R 2002 Proc. SPIE 4679 23
[3] DeFord J F, Kozlowski M R 1993 Proc. SPIE 1848 455
[4] Brusasco R M, Penetrante B M, Butler J A, Hrubesh L W 2002 Proc. SPIE 4679 40
[5] During A, Lamaignére L, Bouchut P, Piombini H 2004 Proc. SPIE 5467 177
[6] Ge D B, Yan Y B 2005 FDTD method for Electromagnetic Waves (Xi'an: Xidian University Press) (in Chinese) [葛德彪, 闫玉波 2005 电磁波时域有限差分方法 (西安: 西安电子科技大学出版社)]
[7] Li L, Xiang X, Zu X T, Wang H J, Yuan X D, Jiang X D, Zheng W G, Dai W 2011 Chin. Phys. B 20 074209
[8] Dai W, Xiang X, Jiang Y, Wang H J, Li X B, Yuan X D, Zheng W G, Lv H B, Zu X T 2011 Opt. Laser Eng. 49 273
[9] Xiang X, Zheng W G, Yuan X D, Dai W Jiang Y, Li X B, Wang H J, Lv H B, Zu X T 2011 Chin. Phys. B 20 044208
[10] During A, Bouchut P, Coutard J G, Leymarie C, Bercegol H 2006 Proc. SPIE 6403 640323
[11] Tomozawa M, Li C Y, Gross T M 2010 Journal of Non-Crystalline Solids 356 1194
[12] Guss G, Bass I, Draggoo V, Hackel R, Payne S, Lancaster M, Mak P 2006 Proc. SPIE 6403 64030M
[13] Hua J R, Li L, Xiang X, Zu X T 2011 Acta. Phys. Sin. 60 044206 (in Chinese) [花金荣, 李莉, 向霞, 祖小涛 2011 物理学报 60 044206]
[14] Hua J R, Jiang X D, Zu X T 2010 High Power Laser and Part. Beams 22 1441 (in Chinese) [花金荣, 蒋晓东, 祖小涛 2010 强激光与粒子束 22 1441]
[15] Brusasco R M, Penetrante B M, Butler J A, Maricle S M, Peterson J E 2002 Proc. SPIE 4679 34
[16] Qiu S G, Wolfe J E, Monterrosa A M, Feit M D, Pistor T V, Stolz C J 2009 Proc. SPIE 7504 75040M
[17] Gallais L, Cormont P, Rullier J L 2009 Opt. Express 17 23488
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