一种液晶透镜盒间隙的测试方法

唐先柱; 钟德镇; 简廷宪; 陆建钢; 谢汉萍

doi:10.7498/aps.62.174210

摘要

针对当前液晶透镜盒间隙测试存在的难题, 文中提出采用线偏振干涉法测试方法, 采用光强均匀分布的单色光入射, 检偏器的偏光轴方向与起偏器的偏光轴垂直或者平行, 液晶透镜的液晶取向层的摩擦方向与起偏器偏振轴夹角为45°, 此时干涉条纹亮暗差别最明显. 利用液晶透镜中心保持预倾角不变的透过率以及其他位置透过率最大值来计算液晶透镜的盒间隙, 该方法简单、可靠, 因采用光学手段测试, 其精确度相对较高.

关键词:

There was a problem in current cell gap measurement of liquid crystal (LC) lens. A method was proposed by adopting interference of linearly polarized light in this paper. It was claimed that the incident light was monochromatic light with a uniform distribution of light intensity. The polarization axis of the analyzer was perpendicular or parallel to the polarization axis of polarizer. The difference between light and dark interference fringes was the biggest when the angle was equal to 45° between the rubbing direction of alignment layer in the LC lens and the polarization axis of polarizer. The cell gap of LC lens can be calculated by the transmittance of LC lens center and the max transmittance of its other locations. The tilt angle was equal to the pre-tilt angle of LC at the LC lens center. This method was simple and reliable. Its accuracy is relatively high due to the use of optical interference principle.

Keywords:

liquid crystal lens /
cell gap /
interference of linear polarized light /
transmittance

作者及机构信息

1.
上海交通大学, TFT-LCD关键材料及技术国家工程实验室, 上海 200240;

2.
昆山龙腾光电有限公司, 昆山 215301;

3.
国立交通大学, 台湾

基金项目: 江苏省省科技支撑计划(批准号: BE2012862);国家自然科学基金(批准号: 60906039)和上海自然科学基金(批准号: 09ZR1414800)资助的课题.

Authors and contacts

1.
National Engineering Laboratory of TFT-LCD Materials and Technologies, Displays and Lighting Center, Shanghai Jiao Tong University, Shanghai 200240, China;

2.
Infovision Optoelectronics Co. Ltd., Kunshan 215301, China;

3.
National Chiao Tung University (NCTU), Hsinchu, Taiwan, China

Funds: Project supported by the Jiangsu Provincial Science and Technology Support Program (Grant No. BE2012862), the National Natural Science Foundation of China (Grant No. 60906039), and the Shanghai Natural Science Foundation, China (Grant No. 09ZR1414800).

参考文献

[1]	Wang F, Zhao X, Yong Y, Fang Z L, Yuan X C 2012 Acta Phys. Si. 61 084212 (in Chinese) [王芳, 赵星, 杨勇, 方志良, 袁小聪 2012 物理学报 61 084212]
[2]	Sato S 1979 Jpn. J. Appl. Phys. 18 1679
[3]	Berreman D W 1980 U.S. Patent 4190330
[4]	Zheng Z G, Ma J, Song J, Liu Y G, Hu L F, Xuan L 2007 Acta Phys. Sin. 56 15 (in Chinese) [郑致刚, 马骥, 宋静, 刘永刚, 胡立发, 宣丽 2007 物理学报 56 15]
[5]	Yang P B, Cao L G, Hu W, Zhu Y Q, Guo Q, Yang X B 2008 Acta Phys. Sin. 57 285 (in Chinese) [杨平保, 曹龙贵, 胡巍, 朱叶青, 郭旗, 杨湘波 2008 物理学报 57 285]
[6]	Zheng Z G, Li W C, Liu Y G, Xuan L 2008 Acta Phys. Sin. 57 7344 (in Chinese) [郑致刚, 李文萃, 刘永刚, 宣丽 2008 物理学报 57 7344]
[7]	Yin J L, Huang X G, Liu S H, Hu S J 2006 Acta Phys. Sin. 55 5268 (in Chinese) [殷建玲, 黄旭光, 刘颂豪, 胡社军 2006 物理学报 55 5268]
[8]	Ding H B, Pang W N, Liu Y B, Shang R C 2005 Acta Phys. Sin. 54 4097 (in Chinese) [丁海兵, 庞文宁, 刘义保, 尚仁成 2005 物理学报 54 4097]
[9]	Ren H W, Fan Y H, Gauza S, Wu S T 2004 Appl. Phys. Lett. 84 4789
[10]	Nose T, Masuda S, Sato S 1992 Jpn. J. Appl. Phys. 31 1643
[11]	Ye M, Wang B, Sato S 2004 AO 43 6407

施引文献

[1]	Wang F, Zhao X, Yong Y, Fang Z L, Yuan X C 2012 Acta Phys. Si. 61 084212 (in Chinese) [王芳, 赵星, 杨勇, 方志良, 袁小聪 2012 物理学报 61 084212]
[2]	Sato S 1979 Jpn. J. Appl. Phys. 18 1679
[3]	Berreman D W 1980 U.S. Patent 4190330
[4]	Zheng Z G, Ma J, Song J, Liu Y G, Hu L F, Xuan L 2007 Acta Phys. Sin. 56 15 (in Chinese) [郑致刚, 马骥, 宋静, 刘永刚, 胡立发, 宣丽 2007 物理学报 56 15]
[5]	Yang P B, Cao L G, Hu W, Zhu Y Q, Guo Q, Yang X B 2008 Acta Phys. Sin. 57 285 (in Chinese) [杨平保, 曹龙贵, 胡巍, 朱叶青, 郭旗, 杨湘波 2008 物理学报 57 285]
[6]	Zheng Z G, Li W C, Liu Y G, Xuan L 2008 Acta Phys. Sin. 57 7344 (in Chinese) [郑致刚, 李文萃, 刘永刚, 宣丽 2008 物理学报 57 7344]
[7]	Yin J L, Huang X G, Liu S H, Hu S J 2006 Acta Phys. Sin. 55 5268 (in Chinese) [殷建玲, 黄旭光, 刘颂豪, 胡社军 2006 物理学报 55 5268]
[8]	Ding H B, Pang W N, Liu Y B, Shang R C 2005 Acta Phys. Sin. 54 4097 (in Chinese) [丁海兵, 庞文宁, 刘义保, 尚仁成 2005 物理学报 54 4097]
[9]	Ren H W, Fan Y H, Gauza S, Wu S T 2004 Appl. Phys. Lett. 84 4789
[10]	Nose T, Masuda S, Sato S 1992 Jpn. J. Appl. Phys. 31 1643
[11]	Ye M, Wang B, Sato S 2004 AO 43 6407

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