基于局部放电理论的聚合物电介质击穿动力学理论研究

李丹; 胡海云

doi:10.7498/aps.63.117701

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摘要

随着电力设备电压等级的提高，对电力设备中聚合物电介质材料的可靠性提出了更加严格的要求，然而由于聚合物电介质材料在生产制造过程中不可避免的存在气泡、杂质等缺陷，导致在高电场作用下会发生局部放电从而大大降低了电力设备的使用寿命. 因此，为了预防和减少电力设备中因聚合物电介质材料老化所带来的事故，需要合理地估算其电老化寿命. 本文从局部放电老化模型的微观机理出发，利用非平衡态统计理论建立了电裂纹不断扩展的随机微分方程，然后推导出聚合物电介质的击穿概率、可靠性以及电老化寿命与外加电场的函数关系. 最后，对聚苯二甲酸乙二醇酯（polyetllyleneterephthalate，PET）薄膜材料进行具体分析，将电老化寿命公式的理论值与实验数据作了比较，发现实验数据与理论值较为相符. 因此，本文推导的聚合物电介质电老化寿命公式可以有效地应用在定量分析中，并有望为材料的电寿命预测提供帮助.

关键词:

作者及机构信息

李丹,
胡海云

1.
北京理工大学物理学院, 北京 100081

基金项目: 国家自然科学基金（批准号：11272053）资助的课题.

参考文献

[1]	Yang K, Zhang G Z, Zhao W B, Yan Z 2008 Chin. Soc. for Elec. Eng. 28 148 (in Chinese)[杨凯, 张冠军, 赵文彬, 严璋 2008 中国电机工程学报 28 148]
[2]	Li S T, Zheng X Q 2006 Polymer Electrical Treeing (Beijing: China Machine Press) p10 (in Chinese) [李盛涛, 郑晓泉 2006 聚合物电树枝化(北京:机械工业出版社)第10页]
[3]	Zheng X Q, Xie A S, Li S T 2007 Acta Phys. Sin. 56 5494 (in Chinese)[郑晓泉, 谢安生, 李盛涛 2007 物理学报 56 5494]
[4]	Chen X R, Xu Y, Liu Y, Cao X L 2012 Acta Phys. Sin. 61 087701 (in Chinese) [陈向荣, 徐阳, 刘英, 曹晓珑 2012 物理学报 61 087701]
[5]	Zhao L, Su J C, Pan Y F, Zhang X B 2012 Chin. Phys. B 21 033102
[6]	Straton R 1961 Prog. Dielectrics 3 233
[7]	O’Dwyer J J 1969 J. Electrochem. Soc. 116 239
[8]	Budenstein P P 1980 IEEE Trans. Electron. Insul. 15 225
[9]	Jonscher A K, Laccste R 1984 IEEE Trans. Electron. Insul. 19 190
[10]	Simoni L 1981 IEEE Trans. Electron. Insul. 16 277
[11]	Kao C K 1984 J. Appl. Phys. 55 752
[12]	Liao R J, Zhou T C, Chen G, Yang L J 2012 Acta Phys. Sin. 61 017201 (in Chinese) [廖瑞金, 周天春, George Chen, 杨丽君 2012 物理学报 61 017201]
[13]	Xie A S, Li S T, Zheng X Q 2008 Acta Phys. Sin. 57 3828 (in Chinese)[谢安生, 李盛涛, 郑晓泉 2008 物理学报 57 3828]
[14]	Xing X S 1991 Adv. Mech. 21 153 (in Chinese)[邢修三 1991 力学进展 21 153]
[15]	Xing X S 1986 Sci. Chin. (Vol. A) 29 501 (in Chinese) [邢修三 1986 中国科学(A辑) 29 501]
[16]	Bahder G, Garrity T, Duxbury M 1983 Phys. Rev. Lett. 53 1121
[17]	Townsend J S 1910 The Theory of Ionization of Gases by Collision (London: Constable & Company Ltd.) pp1-24
[18]	O'Dwyer J J 1984 IEEE Trans. Electron. Insul. 19 1
[19]	Kottalam J, Lindenberg K, West B J 1987 J. Stat. Phys. 42 979
[20]	Van Kampen N G 1981 J. Stat. Phys. 24 175
[21]	Zou J, Xing X S 1997 Trans. Beijing Inst. Technol. 17 160 (in Chinese) [邹健, 邢修三 1997 北京理工大学学报 17 160]
[22]	Dissdo L A, Fothergill J C 1992 Electrical Degradation and Breakdown in Polymers (London: Peter Peregrinus Ltd.) pp323-329
[23]	Liu F D, Yang B T, Tu D M 1992 Acta Phys. Sin. 41 333 (in Chinese)[刘付德, 杨百屯, 屠德民 1992 物理学报 41 333]

施引文献

[1]	Yang K, Zhang G Z, Zhao W B, Yan Z 2008 Chin. Soc. for Elec. Eng. 28 148 (in Chinese)[杨凯, 张冠军, 赵文彬, 严璋 2008 中国电机工程学报 28 148]
[2]	Li S T, Zheng X Q 2006 Polymer Electrical Treeing (Beijing: China Machine Press) p10 (in Chinese) [李盛涛, 郑晓泉 2006 聚合物电树枝化(北京:机械工业出版社)第10页]
[3]	Zheng X Q, Xie A S, Li S T 2007 Acta Phys. Sin. 56 5494 (in Chinese)[郑晓泉, 谢安生, 李盛涛 2007 物理学报 56 5494]
[4]	Chen X R, Xu Y, Liu Y, Cao X L 2012 Acta Phys. Sin. 61 087701 (in Chinese) [陈向荣, 徐阳, 刘英, 曹晓珑 2012 物理学报 61 087701]
[5]	Zhao L, Su J C, Pan Y F, Zhang X B 2012 Chin. Phys. B 21 033102
[6]	Straton R 1961 Prog. Dielectrics 3 233
[7]	O’Dwyer J J 1969 J. Electrochem. Soc. 116 239
[8]	Budenstein P P 1980 IEEE Trans. Electron. Insul. 15 225
[9]	Jonscher A K, Laccste R 1984 IEEE Trans. Electron. Insul. 19 190
[10]	Simoni L 1981 IEEE Trans. Electron. Insul. 16 277
[11]	Kao C K 1984 J. Appl. Phys. 55 752
[12]	Liao R J, Zhou T C, Chen G, Yang L J 2012 Acta Phys. Sin. 61 017201 (in Chinese) [廖瑞金, 周天春, George Chen, 杨丽君 2012 物理学报 61 017201]
[13]	Xie A S, Li S T, Zheng X Q 2008 Acta Phys. Sin. 57 3828 (in Chinese)[谢安生, 李盛涛, 郑晓泉 2008 物理学报 57 3828]
[14]	Xing X S 1991 Adv. Mech. 21 153 (in Chinese)[邢修三 1991 力学进展 21 153]
[15]	Xing X S 1986 Sci. Chin. (Vol. A) 29 501 (in Chinese) [邢修三 1986 中国科学(A辑) 29 501]
[16]	Bahder G, Garrity T, Duxbury M 1983 Phys. Rev. Lett. 53 1121
[17]	Townsend J S 1910 The Theory of Ionization of Gases by Collision (London: Constable & Company Ltd.) pp1-24
[18]	O'Dwyer J J 1984 IEEE Trans. Electron. Insul. 19 1
[19]	Kottalam J, Lindenberg K, West B J 1987 J. Stat. Phys. 42 979
[20]	Van Kampen N G 1981 J. Stat. Phys. 24 175
[21]	Zou J, Xing X S 1997 Trans. Beijing Inst. Technol. 17 160 (in Chinese) [邹健, 邢修三 1997 北京理工大学学报 17 160]
[22]	Dissdo L A, Fothergill J C 1992 Electrical Degradation and Breakdown in Polymers (London: Peter Peregrinus Ltd.) pp323-329
[23]	Liu F D, Yang B T, Tu D M 1992 Acta Phys. Sin. 41 333 (in Chinese)[刘付德, 杨百屯, 屠德民 1992 物理学报 41 333]

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基于局部放电理论的聚合物电介质击穿动力学理论研究

1. 北京理工大学物理学院, 北京 100081

基金项目:

国家自然科学基金（批准号：11272053）资助的课题.

收稿日期: 2013-09-23

修回日期: 2014-01-14

刊出日期: 2014-06-05

摘要: 随着电力设备电压等级的提高，对电力设备中聚合物电介质材料的可靠性提出了更加严格的要求，然而由于聚合物电介质材料在生产制造过程中不可避免的存在气泡、杂质等缺陷，导致在高电场作用下会发生局部放电从而大大降低了电力设备的使用寿命. 因此，为了预防和减少电力设备中因聚合物电介质材料老化所带来的事故，需要合理地估算其电老化寿命. 本文从局部放电老化模型的微观机理出发，利用非平衡态统计理论建立了电裂纹不断扩展的随机微分方程，然后推导出聚合物电介质的击穿概率、可靠性以及电老化寿命与外加电场的函数关系. 最后，对聚苯二甲酸乙二醇酯（polyetllyleneterephthalate，PET）薄膜材料进行具体分析，将电老化寿命公式的理论值与实验数据作了比较，发现实验数据与理论值较为相符. 因此，本文推导的聚合物电介质电老化寿命公式可以有效地应用在定量分析中，并有望为材料的电寿命预测提供帮助.

关键词:

Studies on the kinetic theory of polymer dielectric breakdown due to partial discharge

1.
School of Physics, Beijing Institute of Technology, Beijing 100081, China

Fund Project:

Project supported by the National Natural Science Foundation of China (Grant No. 11272053).

Received Date: 23 September 2013

Accepted Date: 14 January 2014

Published Online: 05 June 2014

Abstract: With the improvement of voltage level of electrical equipment, the requirement for the reliability of polymer dielectric materials in electrical equipment is much more strict. However, there are inevitably some defects in the manufacturing process of polymer dielectric materials, such as bubbles, inclusions, and so on. Therefore the life of electrical equipment will be greatly decreased when partial discharge occurs in a high electric field. In order to prevent and reduce the accident caused by the aging of polymer dielectric material in the electrical equipment, electrical aging life needs to be reasonably estimated. Based on the microscopic mechanism of partial discharge aging model, this paper suggests a stochastic differential equation for the electrical crack growth by using a non-equilibrium statistical physics theory, and then functions of breakdown probability, reliability, and electrical aging life due to the application of electric field are derived. Finally, a detailed analysis for the polyetllyleneterephthalate (PET) film is carried out, and the theoretical life of electrical aging is compared with experimental data. Results show that the theoretical values are consistent with the experimental data. So the aging life equations of polymer dielectrics derived in this paper can be used effectively in the quantitative analysis and may be helpful for the estimation of electrical life.

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