X射线衍射仪固有角度刻度误差对点阵参数计算精确度影响的研究

徐晓明; 苗伟; 陶琨

doi:10.7498/aps.63.136001

摘要

本文研究粉末衍射仪客观存在的固有角度刻度误差导致的测量角度变化对点阵参数计算精确度的影响，它理论上代表着各台衍射仪（不同实验室）所得到的点阵参数的一致性的极限. 具体方法为利用多个带有角度随机误差的多晶硅计算谱，模拟某种制造精度的多台衍射仪的测量结果，并使用三种方法进行点阵参数的拟合计算，从而进行分析.

关键词:

This paper studies the effect of measuring angle error in X-ray powder diffractometer, which is caused by diffractometer inherent angle scale error resulting from mechanical manufacture, on the precision of calculated lattice parameter. It represents the theoretical limit of the consistency of the lattice parameters obtained by different diffractometers and laboratories. We use the calculated polysilicon diffraction patterns with random angle error to simulate the results measured by many sets of diffractometers of some manufacturing precision, then calculate and analyze the lattice parameters by three methods.

Keywords:

作者及机构信息

1.
清华大学材料科学与工程研究院中心实验室, 北京 100084

Authors and contacts

1.
Center for Testing and Analyzing of Materials, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China

参考文献

[1]	FEWSTER P F 1999 J. Mater. Sci.-Mater. Electron. 10 175
[2]
[3]	Liang J K Crystal structure determination by X-ray powder diffraction (Vol. 2) (Beijing: Science Press) p486 (in Chinese) [梁敬魁. 粉末衍射法测定晶体结构(下) (北京: 科学出版社) p486]
[4]
[5]	Chen X C, Zhou J P, Wang H Y, Xu P S, Pan G Q 2011 Chin. Phys. B 20 096102
[6]
[7]	Li G N, Rao G H, Huang Q Z, Gao Q Q, Luo J, Liu G Y, Li J B, Liang J K 2014 Chin. Phys. B 23 036401
[8]	Wang Z C, He L H, Cuevas F, Latroche M, Shen J, Wang F W 2011 Chin. Phys. B 20 067502
[9]
[10]	Parrish W 1960 Acta Cryst. 13 838
[11]
[12]
[13]	Hubbard C R, Swanson H E, Mauer F A 1975 J. Appl. Cryst. 8 45
[14]	Block S, Hubbard C R 1980 Proceedings of Symposium on Accuracy in Powder Diffraction Maryland June 11-15, 1979
[15]
[16]	Lu X S 1980 Acta Phys. Sin. 29 273 (in Chinese) [陆学善 1980 物理学报 29 273]
[17]
[18]	Guo C L, Ma L T 1982 Chin. Sci. Bull. 8 467 (in Chinese) [郭常霖, 马利泰 1982 科学通报 8 467]
[19]
[20]
[21]	Guo C L, Huang Y H 1981 Acta Phys. Sin. 30 124 (in Chinese) [郭常霖, 黄月鸿 1981 物理学报 30 124]
[22]
[23]	Guo C L, Huang Y H 1986 J. Chin. Ceram. Soci. 14 129 (in Chinese)[郭常霖, 黄月鸿 1986 硅酸盐学报 14 129]
[24]
[25]	Xu X M, Miao W, Tao K 2011 Acta Phys. Sin. 60 086101 (in Chinese)[徐晓明, 苗伟, 陶琨 2011 物理学报 60 086101]

施引文献

[1]	FEWSTER P F 1999 J. Mater. Sci.-Mater. Electron. 10 175
[2]
[3]	Liang J K Crystal structure determination by X-ray powder diffraction (Vol. 2) (Beijing: Science Press) p486 (in Chinese) [梁敬魁. 粉末衍射法测定晶体结构(下) (北京: 科学出版社) p486]
[4]
[5]	Chen X C, Zhou J P, Wang H Y, Xu P S, Pan G Q 2011 Chin. Phys. B 20 096102
[6]
[7]	Li G N, Rao G H, Huang Q Z, Gao Q Q, Luo J, Liu G Y, Li J B, Liang J K 2014 Chin. Phys. B 23 036401
[8]	Wang Z C, He L H, Cuevas F, Latroche M, Shen J, Wang F W 2011 Chin. Phys. B 20 067502
[9]
[10]	Parrish W 1960 Acta Cryst. 13 838
[11]
[12]
[13]	Hubbard C R, Swanson H E, Mauer F A 1975 J. Appl. Cryst. 8 45
[14]	Block S, Hubbard C R 1980 Proceedings of Symposium on Accuracy in Powder Diffraction Maryland June 11-15, 1979
[15]
[16]	Lu X S 1980 Acta Phys. Sin. 29 273 (in Chinese) [陆学善 1980 物理学报 29 273]
[17]
[18]	Guo C L, Ma L T 1982 Chin. Sci. Bull. 8 467 (in Chinese) [郭常霖, 马利泰 1982 科学通报 8 467]
[19]
[20]
[21]	Guo C L, Huang Y H 1981 Acta Phys. Sin. 30 124 (in Chinese) [郭常霖, 黄月鸿 1981 物理学报 30 124]
[22]
[23]	Guo C L, Huang Y H 1986 J. Chin. Ceram. Soci. 14 129 (in Chinese)[郭常霖, 黄月鸿 1986 硅酸盐学报 14 129]
[24]
[25]	Xu X M, Miao W, Tao K 2011 Acta Phys. Sin. 60 086101 (in Chinese)[徐晓明, 苗伟, 陶琨 2011 物理学报 60 086101]

姓名
邮箱
手机号码
标题
留言内容
验证码

搜索

留言板