| 引用本文: |
|
| Citation: |
|
计量
- 文章访问数: 3343
- PDF下载量: 486
- 被引次数: 0
物理学报. 1998, 47(11): 1853-1857.
doi: 10.7498/aps.47.1853.
石墨薄片弯曲度的高分辨率电子显微镜研究
- 收稿日期: 1998-01-20
- 修回日期: 1998-03-30
- 刊出日期: 1998-11-20
摘要: 报道了一种用高序石墨在乙醇、水或乙醇水混合溶液中超声波处理产生的碳样品．高分辨率电子显微镜揭示出大量具有总角度为θ0（±30℃）倍数的弯曲石墨片存在．显微镜检查表明，弯曲是通过原子晶格平面的偏转而成的．基于石墨的对称轴结构和在sp2石墨网络中类-sp3线缺陷的形成，讨论了石墨片弯曲的可能解释.
English Abstract
A HIGH RESOLUTION ELECTRON MICROSCOPY INVESTIGATION OF CURVATURE IN MULTILAYER GRAPHITE SHEETS
- Received Date:
20 January 1998
- Accepted Date:
30 March 1998
- Published Online:
20 November 1998
Abstract: Here we report a carbon sample generated by sonicating high oriented pyrolytic graphite (HOPG) in ethanol, water or ethanol-water mixed solution. High resolution transmission electron microscopy (HRTEM) revealed many multilayer graphite sheets with a total curved angle that is multiples of θ0(=30°). Close examination of the micrographs showed that the curvature is accomplished by bending the lattice planes. A possible explanation for the curvature in multilayer graphite sheets is discussed based on the conformation of graphite symmetry axes and the formation of sp3-like line defects in the sp2 graphitic network.
下载:
