-
[1] Benuzzi A, Löwer T, Koenig M, Faral B, Batani D, Beretta D, Danson C, Pepler D 1996 Phys. Rev. E 54 2162
[2] Batani D, Morelli A, Tomasini M, et al. 2002 Phys. Rev. Lett. 88 235502
[3] Batani D, Strati F, Stabile H, et al. 2004 Phys. Rev. Lett. 92 065503
[4] Boehly T R, Vianello E, Miller J E, Craxton R S, Collins T J B, Goncharov V N, Igumenshchev I V, Meyerhofer D D, Hicks D G, Celliers P M, Collins G W 2006 Phys. Plasmas 13 056303
[5] Barrios M A, Hicks D G, Boehly T R, Fratanduono D E, Eggert J H, Celliers P M, Collins G W, Meyerhofer D D 2010 Phys. Plasmas 17 056307
[6] Sano T, Ozaki N, Sakaiya T, Shigemori K, Ikoma M, Kimura T, Miyanishi K, Endo T, Shiroshita A, Takahashi H, Jitsui T, Hori Y, Hironaka Y, Iwamoto A, Kadono T, Nakai M, Okuchi T, Ohtani K, Shimizu K, Kondo T, Kodama R, Mima K 2011 Phys. Rev. B 83 054117
[7] Jeanloz R, Celliers P M, Collins G W, Eggert J H, Lee K K M, McWilliams R S, Brygoo S, Loubeyre P 2007 Proc. Natl. Acad. Sci. USA 104 9172
[8] Loubeyre P, Celliers P M, Hicks D G, Henry E, Dawaele A, Pasley J, Eggert J, Koenig M, Occelli F, Lee K K M, et al. 2004 High-Pressure Res. 24 25
[9] Lee K K M, Benedetti L R, Jeanloz R, Celliers P M, Eggert J H, Hicks D G, Moon S J, Mackinnon A, Da Silva L B, Bradley D K, et al. 2006 J. Chem. Phys. 125 014701
[10] Eggert J, Brygoo S, Loubeyre P, McWilliams R S, Celliers P M, Hicks D G, Boehly T R, Jeanloz R, Collins G W 2008 Phys. Rev. Lett. 100 124503
[11] Celliers P M, Loubeyre P, Eggert J H, Brygoo S, McWilliams R S, Hicks D G, Boehly T R, Jeanloz R, Collins G W 2010 Phys. Rev. Lett. 104 184503
[12] Loubeyre P, Brygoo S, Eggert J, Celliers P M, Spaulding D K, Rygg J R, Boehly T R, Collins G W, Jeanloz R 2012 Phys. Rev. B 86 144115
[13] Kimura T, Ozaki N, Sano T, Okuchi T, Sano T, Shimizu K, Miyanishi K, Terai T, Kakeshita T, Sakawa Y, Kodama R 2015 J. Chem. Phys. 142 164504
[14] Seagle C T, Reinhart W D, Lopez A J, Hickman R J, Thornhill T F 2016 J. Appl. Phys. 120 125902
[15] Knudson M D, Desjarlais M P 2009 Phys. Rev. Lett. 103 225501
[16] Hicks D G, Boehly T R, Celliers P M, Eggert J H, Vianello E, Meyerhofer D D, Collins G W 2005 Phys. Plasmas 12 082702
[17] Mao H K, Bell P M, Shaner J W, Steinberg D J 1978 J. Appl. Phys. 49 3276
[18] Deng X M, Liang X C, Chen Z 1986 Appl. Opt. 25 377
[19] Fu S Z, Gu, Y, Wu J, Wang S J 1995 Phys. Plasmas 2 3461
[20] Shu H, Huang X G, Ye J J, Jia G, Wu J, Fu S Z 2017 Laser Part. Beams 35 145
[21] Shu H, Fu S Z, Huang X G, Ye J J, Zhou H Z, Xie Z Y, Long T 2012 Acta Phys. Sin. 61 114102 (in Chinese) [舒桦, 傅思祖, 黄秀光, 叶君建, 周华珍, 谢志勇, 龙滔 2012 物理学报 61 114102]
[22] Celliers P M, Bradley D K, Collins G W, Hicks D G, Boehly T R, Armstrong W J 2004 Rev. Sci. Instrum. 75 4916
[23] Shu H, Fu S Z, Huang X G, Wu J, Zhou H Z, Ye J J 2012 Meas. Sci. Technol. 23 015203
[24] Miller J E, Boehly T R, Melchior A, Meyerhofer D D, Celliers P M, Eggert J H, Hicks D G, Sorce C M, Oertel J A, Emmel P M 2007 Rev. Sci. Instrum. 78 034903
[25] French M, Mattsson T R, Nettelmann N, Redmer R 2009 Phys. Rev. B 79 054107
-
[1] Benuzzi A, Löwer T, Koenig M, Faral B, Batani D, Beretta D, Danson C, Pepler D 1996 Phys. Rev. E 54 2162
[2] Batani D, Morelli A, Tomasini M, et al. 2002 Phys. Rev. Lett. 88 235502
[3] Batani D, Strati F, Stabile H, et al. 2004 Phys. Rev. Lett. 92 065503
[4] Boehly T R, Vianello E, Miller J E, Craxton R S, Collins T J B, Goncharov V N, Igumenshchev I V, Meyerhofer D D, Hicks D G, Celliers P M, Collins G W 2006 Phys. Plasmas 13 056303
[5] Barrios M A, Hicks D G, Boehly T R, Fratanduono D E, Eggert J H, Celliers P M, Collins G W, Meyerhofer D D 2010 Phys. Plasmas 17 056307
[6] Sano T, Ozaki N, Sakaiya T, Shigemori K, Ikoma M, Kimura T, Miyanishi K, Endo T, Shiroshita A, Takahashi H, Jitsui T, Hori Y, Hironaka Y, Iwamoto A, Kadono T, Nakai M, Okuchi T, Ohtani K, Shimizu K, Kondo T, Kodama R, Mima K 2011 Phys. Rev. B 83 054117
[7] Jeanloz R, Celliers P M, Collins G W, Eggert J H, Lee K K M, McWilliams R S, Brygoo S, Loubeyre P 2007 Proc. Natl. Acad. Sci. USA 104 9172
[8] Loubeyre P, Celliers P M, Hicks D G, Henry E, Dawaele A, Pasley J, Eggert J, Koenig M, Occelli F, Lee K K M, et al. 2004 High-Pressure Res. 24 25
[9] Lee K K M, Benedetti L R, Jeanloz R, Celliers P M, Eggert J H, Hicks D G, Moon S J, Mackinnon A, Da Silva L B, Bradley D K, et al. 2006 J. Chem. Phys. 125 014701
[10] Eggert J, Brygoo S, Loubeyre P, McWilliams R S, Celliers P M, Hicks D G, Boehly T R, Jeanloz R, Collins G W 2008 Phys. Rev. Lett. 100 124503
[11] Celliers P M, Loubeyre P, Eggert J H, Brygoo S, McWilliams R S, Hicks D G, Boehly T R, Jeanloz R, Collins G W 2010 Phys. Rev. Lett. 104 184503
[12] Loubeyre P, Brygoo S, Eggert J, Celliers P M, Spaulding D K, Rygg J R, Boehly T R, Collins G W, Jeanloz R 2012 Phys. Rev. B 86 144115
[13] Kimura T, Ozaki N, Sano T, Okuchi T, Sano T, Shimizu K, Miyanishi K, Terai T, Kakeshita T, Sakawa Y, Kodama R 2015 J. Chem. Phys. 142 164504
[14] Seagle C T, Reinhart W D, Lopez A J, Hickman R J, Thornhill T F 2016 J. Appl. Phys. 120 125902
[15] Knudson M D, Desjarlais M P 2009 Phys. Rev. Lett. 103 225501
[16] Hicks D G, Boehly T R, Celliers P M, Eggert J H, Vianello E, Meyerhofer D D, Collins G W 2005 Phys. Plasmas 12 082702
[17] Mao H K, Bell P M, Shaner J W, Steinberg D J 1978 J. Appl. Phys. 49 3276
[18] Deng X M, Liang X C, Chen Z 1986 Appl. Opt. 25 377
[19] Fu S Z, Gu, Y, Wu J, Wang S J 1995 Phys. Plasmas 2 3461
[20] Shu H, Huang X G, Ye J J, Jia G, Wu J, Fu S Z 2017 Laser Part. Beams 35 145
[21] Shu H, Fu S Z, Huang X G, Ye J J, Zhou H Z, Xie Z Y, Long T 2012 Acta Phys. Sin. 61 114102 (in Chinese) [舒桦, 傅思祖, 黄秀光, 叶君建, 周华珍, 谢志勇, 龙滔 2012 物理学报 61 114102]
[22] Celliers P M, Bradley D K, Collins G W, Hicks D G, Boehly T R, Armstrong W J 2004 Rev. Sci. Instrum. 75 4916
[23] Shu H, Fu S Z, Huang X G, Wu J, Zhou H Z, Ye J J 2012 Meas. Sci. Technol. 23 015203
[24] Miller J E, Boehly T R, Melchior A, Meyerhofer D D, Celliers P M, Eggert J H, Hicks D G, Sorce C M, Oertel J A, Emmel P M 2007 Rev. Sci. Instrum. 78 034903
[25] French M, Mattsson T R, Nettelmann N, Redmer R 2009 Phys. Rev. B 79 054107
| 引用本文: |
|
| Citation: |
|
计量
- 文章访问数: 1171
- PDF下载量: 142
- 被引次数: 0
下载:
