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Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy

Wang Qiao-Zhan Li Yu-Xiao Yu Run-Sheng Qin Xiu-Bo Wang Bao-Yi Jia Quan-Jie

Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy

Wang Qiao-Zhan, Li Yu-Xiao, Yu Run-Sheng, Qin Xiu-Bo, Wang Bao-Yi, Jia Quan-Jie
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  • Received Date:  27 February 2009
  • Accepted Date:  22 April 2009
  • Published Online:  20 December 2009

Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy

  • 1. (1)郑州大学物理工程学院,郑州 450001; (2)中国科学院高能物理研究所核分析技术重点实验室,北京 100049

Abstract: Mesoporous silica thin films with different pore shapes were prepared by evaporation induced self-assembly method. The synchrotron radiation x-ray reflectivity and slow positron annihilation techniques were used to characterize the pore structures. The results indicated that with increase of the spin-coating speed, the pore structure transformed from 3-D cubic to 2-D hexagonal, the average porosity also decreased. The correlation of the film structures and positron annihilation parameters was songht for with FT-IR spectroscopy and isotropic inorganic pore contraction model.

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