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Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission

Zhang Wang Xu Fa-Qiang Wang Guo-Dong Zhang Wen-Hua Li Zong-Mu Wang Li-Wu Chen Tie-Xin

Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission

Zhang Wang, Xu Fa-Qiang, Wang Guo-Dong, Zhang Wen-Hua, Li Zong-Mu, Wang Li-Wu, Chen Tie-Xin
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  • Synchrotron radiation photoemission spectroscopy (SRPES) and conventional X-ray photoelectron spectroscopy (XPS) were used to study the Fe/ZnO(0001 ) interface formation at room temperature. The interaction extent of Fe overlayer during the ZnO substrate was carefully monitored during the increase of Fe coverage, the results showed obvious Fe2+ formation at the initial stage of Fe deposition. Based on the photoemission spectra (PES) changes observed during the deposition of Fe on ZnO up to 3 nm, three meaningful and critical thicknesses have been observed which may be related to the surface charge transport, chemical reaction, and magnetic property, respectively. The new finding may be helpful to the design of related devices based on Fe/ZnO interface.
    • Funds:
    [1]

    Campbell C T 1997 Surf. Sci. Rep. 27 1

    [2]

    Freund H J 2001 Surf. Sci. 500 271

    [3]

    Valeri S, Benedetti S, Luches P 2007 J. Phys.: Condens. Matter 19 225002

    [4]

    Arranz A, Pérez-Dieste V, Palaci C 2002 Surf. Sci. 521 77

    [5]

    Luches P, Bellini V, Colonna S, Di Giustino L, Manghi F, Valeri S, Boscherini F 2006 Phys. Rev. Lett. 96 106106

    [6]

    Koplitz L V, Dulub D, Diebold U 2003 J. Phys. Chem. B 107 10583

    [7]

    Spencer M S 1999 Top. Catal. 8 259

    [8]

    Yoshihara J, Campbell J M, Campbell C T 1998 Surf. Sci. 406 235

    [9]

    Ernst K H, Campbell C T 1993 Phys. Rev. B 47 13782

    [10]

    Radulovic P V, Feigerle C S, Overbury S H 2000 J. Phys. Chem. B 104 3028

    [11]

    Chaturvedi S, Rodriguez J A 1998 Surf. Sci. 401 282

    [12]

    Dumont J, Seldrum T, Couet S, Moisson M, Turover D, Sporken R 2006 J. Vac. Sci. Technol. B 24 2124

    [13]

    Wett D, Demund A, Szargan R 2007 Microchim Acta 156 57

    [14]

    Demund A, Wett D, Szargan R 2008 Surf. Interface Anal. 40 27

    [15]

    Wang G D, Zhang W, Zhang W H, Li Z M, Xu F Q 2007 Acta Phys. Sin. 56 3468(in Chinese)[王国栋、 张 旺、 张文华、 李宗木、 徐法强 2007 物理学报 56 3468]

    [16]

    Parker T M, Condon N G, Lindsay R, Leibsle F M, Thornton G 1998 Surf. Sci. 415 L1046

    [17]

    Eddrief M, Marangolo M, Etgens V H 2006 Phys. Rev. B 73 115315

    [18]

    Girard R T, Tjernberg O, Chiaia G, Sderholm S, Karlsson U O, Wigren C, Nylén H, Lindau I 1997 Surf. Sci. 373 409

    [19]

    Ivanov I, Pollmann J 1981 Phys. Rev. B 24 7275

    [20]

    Ozawa K, Edamoto K 2003 Surf. Sci. 524 78

    [21]

    Dorn R, Lüth H, Büchel M 1977 Phys. Rev. B 16 4675

    [22]

    Ozawa K, Sawada K, Shirotori Y, Edamoto K, Nakatake M 2003 Phys. Rev. B 68 125417

    [23]

    Lad R J, Henrich V E 1989 Phys. Rev. B 39 13478

    [24]

    Christof Wll 2007 Progess in Surf. Sci. 82 55

    [25]

    Jonker B T, Walker K H, Kisker E 1986 Phys. Rev. Lett. 57 142

    [26]

    Vescovo E, Rader O, Carbone C 1993 Phys. Rev. B 47 13051

    [27]

    Kisker E, Schrder K, Gudat W, Campagna M 1985 Phys. Rev. B 31 329

    [28]

    Brookes N B, Clarke C, Johnson P D, Weinert M 1990 Phys. Rev. B 41 2643

    [29]

    Marangolo M, Gustavsson F, Eddrief M, Sainctavit P, Etgens V H, Cros V, Petroff F, George J M, Bencok P, Brookes N B 2002 Phys. Rev. Lett. 88 217202

    [30]

    Lee J M, Kim J Y, Yang S U, Park B G, Park J H, Oh S J, Kim J S 2007 Phys. Rev. B 76 052406

  • [1]

    Campbell C T 1997 Surf. Sci. Rep. 27 1

    [2]

    Freund H J 2001 Surf. Sci. 500 271

    [3]

    Valeri S, Benedetti S, Luches P 2007 J. Phys.: Condens. Matter 19 225002

    [4]

    Arranz A, Pérez-Dieste V, Palaci C 2002 Surf. Sci. 521 77

    [5]

    Luches P, Bellini V, Colonna S, Di Giustino L, Manghi F, Valeri S, Boscherini F 2006 Phys. Rev. Lett. 96 106106

    [6]

    Koplitz L V, Dulub D, Diebold U 2003 J. Phys. Chem. B 107 10583

    [7]

    Spencer M S 1999 Top. Catal. 8 259

    [8]

    Yoshihara J, Campbell J M, Campbell C T 1998 Surf. Sci. 406 235

    [9]

    Ernst K H, Campbell C T 1993 Phys. Rev. B 47 13782

    [10]

    Radulovic P V, Feigerle C S, Overbury S H 2000 J. Phys. Chem. B 104 3028

    [11]

    Chaturvedi S, Rodriguez J A 1998 Surf. Sci. 401 282

    [12]

    Dumont J, Seldrum T, Couet S, Moisson M, Turover D, Sporken R 2006 J. Vac. Sci. Technol. B 24 2124

    [13]

    Wett D, Demund A, Szargan R 2007 Microchim Acta 156 57

    [14]

    Demund A, Wett D, Szargan R 2008 Surf. Interface Anal. 40 27

    [15]

    Wang G D, Zhang W, Zhang W H, Li Z M, Xu F Q 2007 Acta Phys. Sin. 56 3468(in Chinese)[王国栋、 张 旺、 张文华、 李宗木、 徐法强 2007 物理学报 56 3468]

    [16]

    Parker T M, Condon N G, Lindsay R, Leibsle F M, Thornton G 1998 Surf. Sci. 415 L1046

    [17]

    Eddrief M, Marangolo M, Etgens V H 2006 Phys. Rev. B 73 115315

    [18]

    Girard R T, Tjernberg O, Chiaia G, Sderholm S, Karlsson U O, Wigren C, Nylén H, Lindau I 1997 Surf. Sci. 373 409

    [19]

    Ivanov I, Pollmann J 1981 Phys. Rev. B 24 7275

    [20]

    Ozawa K, Edamoto K 2003 Surf. Sci. 524 78

    [21]

    Dorn R, Lüth H, Büchel M 1977 Phys. Rev. B 16 4675

    [22]

    Ozawa K, Sawada K, Shirotori Y, Edamoto K, Nakatake M 2003 Phys. Rev. B 68 125417

    [23]

    Lad R J, Henrich V E 1989 Phys. Rev. B 39 13478

    [24]

    Christof Wll 2007 Progess in Surf. Sci. 82 55

    [25]

    Jonker B T, Walker K H, Kisker E 1986 Phys. Rev. Lett. 57 142

    [26]

    Vescovo E, Rader O, Carbone C 1993 Phys. Rev. B 47 13051

    [27]

    Kisker E, Schrder K, Gudat W, Campagna M 1985 Phys. Rev. B 31 329

    [28]

    Brookes N B, Clarke C, Johnson P D, Weinert M 1990 Phys. Rev. B 41 2643

    [29]

    Marangolo M, Gustavsson F, Eddrief M, Sainctavit P, Etgens V H, Cros V, Petroff F, George J M, Bencok P, Brookes N B 2002 Phys. Rev. Lett. 88 217202

    [30]

    Lee J M, Kim J Y, Yang S U, Park B G, Park J H, Oh S J, Kim J S 2007 Phys. Rev. B 76 052406

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  • Received Date:  30 April 2010
  • Accepted Date:  13 May 2010
  • Published Online:  15 January 2011

Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission

  • 1. National Synchrotron Radiation Laboratory, College of Nuclear Science and Technology, University of Science and Technology of China, Hefei 230029, China

Abstract: Synchrotron radiation photoemission spectroscopy (SRPES) and conventional X-ray photoelectron spectroscopy (XPS) were used to study the Fe/ZnO(0001 ) interface formation at room temperature. The interaction extent of Fe overlayer during the ZnO substrate was carefully monitored during the increase of Fe coverage, the results showed obvious Fe2+ formation at the initial stage of Fe deposition. Based on the photoemission spectra (PES) changes observed during the deposition of Fe on ZnO up to 3 nm, three meaningful and critical thicknesses have been observed which may be related to the surface charge transport, chemical reaction, and magnetic property, respectively. The new finding may be helpful to the design of related devices based on Fe/ZnO interface.

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