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ANALYTICAL ELECTRON MICROSCOPY OF DEFECTS IN PHOTOREFRACTIVE BaTiO3 CRYSTAL

YANG CUI-YING ZHANG DAO-FAN WU XING ZHOU YU-QING FENG GUO-GUANG

ANALYTICAL ELECTRON MICROSCOPY OF DEFECTS IN PHOTOREFRACTIVE BaTiO3 CRYSTAL

YANG CUI-YING, ZHANG DAO-FAN, WU XING, ZHOU YU-QING, FENG GUO-GUANG
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  • Received Date:  15 February 1989
  • Published Online:  08 July 2005

ANALYTICAL ELECTRON MICROSCOPY OF DEFECTS IN PHOTOREFRACTIVE BaTiO3 CRYSTAL

  • 1. (1)中国科学院物理研究所; (2)中国科学院物理研究所,北京电子显微镜实验室

Abstract: Defects in photorefractive BaTiO3 crystal, obtained by the top seed solution growth method, have been studied by analytical electron microscopy. Thin foils containing inclusions for transmission electron micrsocopy (TEM) were prepared by ion milling the mechanically polished thin sections. Combining diffraction and electron energy loss spectroscopy in a TEM, the inclusions were identified as amorphous Ba-Ti-O and Ba6Ti17O40. Other microdefects which are only visible in the TEM have been identified as crystalline precipitates.

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