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AN X Ray Diffraction STUDY ON THE ULTRA-HIGH ELECT-ROMECHANICAL ANISOTROPY IN (Pb0.85Sm0.10)(Ti0.98Mn0.02)O3 PIEZOELECTRIC CERAMICS

ZHOU HENG-NAN ZENG YAN-WEI XUE WAN-RONG FU GUO-FEI

AN X Ray Diffraction STUDY ON THE ULTRA-HIGH ELECT-ROMECHANICAL ANISOTROPY IN (Pb0.85Sm0.10)(Ti0.98Mn0.02)O3 PIEZOELECTRIC CERAMICS

ZHOU HENG-NAN, ZENG YAN-WEI, XUE WAN-RONG, FU GUO-FEI
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  • Received Date:  21 December 1989
  • Published Online:  28 June 2005

AN X Ray Diffraction STUDY ON THE ULTRA-HIGH ELECT-ROMECHANICAL ANISOTROPY IN (Pb0.85Sm0.10)(Ti0.98Mn0.02)O3 PIEZOELECTRIC CERAMICS

  • 1. (1)南京大学物理系,南京,210008; (2)南京化工学院硅工系,南京,210009

Abstract: XRD technique was employed to examine Sm-modified PbTiO3 piezoelectric ceramics with typical ultra-high electromechanical anisotropy. By introducing crystal plane orientation density ρ(hkl) and establishing wall translation model for 90°ferroelectric domain switching, a quantitative analysis and discussion on the domain texture change within the ceramic disks poled at various electric forces has been carried out. The results indicate that 90°domain walls in the modified PbTiO3 ceramics show a strong spatial orientation preference, and little changes in their orientation can result from poling treatment but noticeable wall displacement appears. Another noteworthy result is that the thickness electromechanical coupling coefficient Kt develops with poling field almost at the same pace as the orientation density gain △ρ(002) of the crystal plane (002).

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