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A combined phenomenological model for secondary electron emission

Li Yong-Dong Yang Wen-Jin Zhang Na Cui Wan-Zhao Liu Chun-Liang

A combined phenomenological model for secondary electron emission

Li Yong-Dong, Yang Wen-Jin, Zhang Na, Cui Wan-Zhao, Liu Chun-Liang
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Publishing process
  • Received Date:  22 October 2012
  • Accepted Date:  04 December 2012
  • Published Online:  05 April 2013

A combined phenomenological model for secondary electron emission

  • 1. Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Xi’an Jiaotong University, Xi’an 710049, China;
  • 2. Science and Technology on Space Microwave Laboratory, Xi'an 710100, China
Fund Project:  Project supported by the National Natural Science Foundation of China (Grant No. 50977076) and the National Key Laboratory Foundation of China (Grant No. 9140C530103110C5301).

Abstract: The accuracy of the model for secondary electron yield (SEY) has a remarkable influence on the simulation result of multipactor threshold. A new combined phenomenological model for SEY was proposed based on the corrected Vaughan model and Furman model. It combines virtues of the latter two models by integrating corrected Vaughan model into Furman model for its calculation of yield of true secondary electron. The new model provides high flexibility and accuracy to fit experimental data of SEY as a function. For comparison, experimental data of silver and aluminum alloys were tested with the three models. It was found that the fitting accuracy has been improved by at least 10% under the circumstances of different incident angles of the original electron.

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