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Investigation of atom-optical properties of laser focused Cr atomic deposition

Li Tong-Bao Ma Yan Wang Li-Dong Lu Xiang-Dong

Investigation of atom-optical properties of laser focused Cr atomic deposition

Li Tong-Bao, Ma Yan, Wang Li-Dong, Lu Xiang-Dong
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  • Received Date:  29 December 2008
  • Accepted Date:  08 May 2009
  • Published Online:  20 December 2009

Investigation of atom-optical properties of laser focused Cr atomic deposition

  • 1. (1)同济大学物理系,上海 200092; (2)同济大学物理系,上海 200092;桂林电子科技大学电子工程学院,桂林 541004

Abstract: Gating structure of one dimensional Cr layer is experimentally obtained through the technology of laser focused atomic deposition. The periodicity of grating is (212.8±0.2) nm measured by atomic force microscope, which is just equal to half of the wavelength of laser standing-wave field. Then, based on the semiclassical model and numerical calculation of the Adams-Bashforth-Moulton algorithm, both Cr atom motion trajectories are simulated and the atom-optical properties are analyzed at the same experimental conditions. The results show that the analytical results agree well with the experimental results.

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