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Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission

Zhang Wang Xu Fa-Qiang Wang Guo-Dong Zhang Wen-Hua Li Zong-Mu Wang Li-Wu Chen Tie-Xin

Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission

Zhang Wang, Xu Fa-Qiang, Wang Guo-Dong, Zhang Wen-Hua, Li Zong-Mu, Wang Li-Wu, Chen Tie-Xin
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  • Received Date:  30 April 2010
  • Accepted Date:  13 May 2010
  • Published Online:  15 January 2011

Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission

  • 1. National Synchrotron Radiation Laboratory, College of Nuclear Science and Technology, University of Science and Technology of China, Hefei 230029, China

Abstract: Synchrotron radiation photoemission spectroscopy (SRPES) and conventional X-ray photoelectron spectroscopy (XPS) were used to study the Fe/ZnO(0001 ) interface formation at room temperature. The interaction extent of Fe overlayer during the ZnO substrate was carefully monitored during the increase of Fe coverage, the results showed obvious Fe2+ formation at the initial stage of Fe deposition. Based on the photoemission spectra (PES) changes observed during the deposition of Fe on ZnO up to 3 nm, three meaningful and critical thicknesses have been observed which may be related to the surface charge transport, chemical reaction, and magnetic property, respectively. The new finding may be helpful to the design of related devices based on Fe/ZnO interface.

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