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MORPHOLOGY OF THE COPPER PRECIPITATES IN SILICON SINGLE CRYSTALS

BA TU HE YI-ZHEN

MORPHOLOGY OF THE COPPER PRECIPITATES IN SILICON SINGLE CRYSTALS

BA TU, HE YI-ZHEN
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  • In this article, infra-red microscopy and etching method were used to study the morphology of the copper precipitates in silicon crystals. It was found that a variety of copper precipitates observed by ir microscopy consists of precipitated disks laying in {110} planes and their morphology bears no relation to the properties of the sample.
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  • Received Date:  28 July 1979
  • Published Online:  29 July 2005

MORPHOLOGY OF THE COPPER PRECIPITATES IN SILICON SINGLE CRYSTALS

  • 1. 中国科学院金属研究所

Abstract: In this article, infra-red microscopy and etching method were used to study the morphology of the copper precipitates in silicon crystals. It was found that a variety of copper precipitates observed by ir microscopy consists of precipitated disks laying in {110} planes and their morphology bears no relation to the properties of the sample.

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