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DETERMINATION OF HYDROGEN DEPTH PROFILE IN SOLIDS BY DETECTION OF RECOILED PROTON WITH MeV F IONS

LIU JIA-RUI ZHU PEI-RAN FENG AI-GUO LI DA-WAN

DETERMINATION OF HYDROGEN DEPTH PROFILE IN SOLIDS BY DETECTION OF RECOILED PROTON WITH MeV F IONS

LIU JIA-RUI, ZHU PEI-RAN, FENG AI-GUO, LI DA-WAN
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  • Received Date:  18 February 1987
  • Published Online:  04 July 2005

DETERMINATION OF HYDROGEN DEPTH PROFILE IN SOLIDS BY DETECTION OF RECOILED PROTON WITH MeV F IONS

  • 1. (1)中国科学院物理研究所; (2)中央民族学院物理系

Abstract: Depth profiling of hydrogen in solids has been performed by Elastic Recoil Detection (ERD) with multicharged F ions at a 1.7 MV Tandem accelerator. Both experimental and theoretical analysis show the depth resolution of about 200-300 ? in the near-surface regions of solids. The optimization of the experimental conditions such as scattering geometry and incident beam energy are discussed. The comparison of ERD with multicharged F ions and 1H(19F,αγ)16O resonance reaction at 6.4 MeV for the same samples demonstrated that hydrogen profiling by ERD with F ions is a fast and economic method with low radiation damage and perfect depth resolution.

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