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Ray ellipse method of analyzing the power and polarization state of partially polarized light

Liu Chao Cen Zhao-Feng Li Xiao-Tong Xu Wei-Cai Shang Hong-Bo Neng Fen Chen Li

Ray ellipse method of analyzing the power and polarization state of partially polarized light

Liu Chao, Cen Zhao-Feng, Li Xiao-Tong, Xu Wei-Cai, Shang Hong-Bo, Neng Fen, Chen Li
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Publishing process
  • Received Date:  07 September 2011
  • Accepted Date:  23 November 2011
  • Published Online:  05 July 2012

Ray ellipse method of analyzing the power and polarization state of partially polarized light

  • 1. State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, China;
  • 2. State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Phisics, Chinese Academy of Sciences, Changchun 130033, China
Fund Project:  Project supported by the National Natural Science Foundation of China (Grant Nos. 10875105, 60977101), the Aviation-Science Foundation of China (Grant No. 20090176001), and the Open Foundation of State Key Laboratory of Applied Optics (Grant No. Y1Q03FQK09).

Abstract: It is difficult to cope with the changes in power and polarization for partially polarized light. The light polarization will also affect the image quality, especially for imaging with large numerical aperture. A novel method of analyzing the power and the polarization state of partially polarized light is proposed in this paper. This method has a good intuitiveness and requires much smaller computation. An aplanatic lens system is simulated. Polarization effect caused is analyzed with this method. The results show that for the imaging light the intensity of TM polarized light relatively increases because of large numerical aperture, which will influence image contrast. Imaging in high refractive index medium can be used to improve this problem.

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