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Flat-roof of dynamic equilibrium phenomenon in static negative biase temperature instability effect on power metal-oxide-semiconductor field-effect transistor

Zhang Yue Zhuo Qing-Qing Liu Hong-Xia Ma Xiao-Hua Hao Yue

Citation:

Flat-roof of dynamic equilibrium phenomenon in static negative biase temperature instability effect on power metal-oxide-semiconductor field-effect transistor

Zhang Yue, Zhuo Qing-Qing, Liu Hong-Xia, Ma Xiao-Hua, Hao Yue
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  • Abstract views:  6027
  • PDF Downloads:  377
  • Cited By: 0
Publishing process
  • Received Date:  25 March 2013
  • Accepted Date:  11 April 2013
  • Published Online:  05 August 2013

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