He Bao-Ping, Guo Hong-Xia, Gong Jian-Cheng, Wang Gui-Zhen, Luo Yin-Hong, Li Yong-Hong. Prediction of failure time for floating gate ROM devices at low dose rate in space radiation environmentJ. Acta Physica Sinica, 2004, 53(9): 3125-3129. DOI: 10.7498/aps.53.3125
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Citation:
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He Bao-Ping, Guo Hong-Xia, Gong Jian-Cheng, Wang Gui-Zhen, Luo Yin-Hong, Li Yong-Hong. Prediction of failure time for floating gate ROM devices at low dose rate in space radiation environmentJ. Acta Physica Sinica, 2004, 53(9): 3125-3129. DOI: 10.7498/aps.53.3125
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He Bao-Ping, Guo Hong-Xia, Gong Jian-Cheng, Wang Gui-Zhen, Luo Yin-Hong, Li Yong-Hong. Prediction of failure time for floating gate ROM devices at low dose rate in space radiation environmentJ. Acta Physica Sinica, 2004, 53(9): 3125-3129. DOI: 10.7498/aps.53.3125
|
Citation:
|
He Bao-Ping, Guo Hong-Xia, Gong Jian-Cheng, Wang Gui-Zhen, Luo Yin-Hong, Li Yong-Hong. Prediction of failure time for floating gate ROM devices at low dose rate in space radiation environmentJ. Acta Physica Sinica, 2004, 53(9): 3125-3129. DOI: 10.7498/aps.53.3125
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