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CeO2/Nb2O5界面效应对提高CeO2氧敏特性的XPS研究

杜新华 刘振祥 谢 侃 王燕斌 褚武扬

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CeO2/Nb2O5界面效应对提高CeO2氧敏特性的XPS研究

杜新华, 刘振祥, 谢 侃, 王燕斌, 褚武扬

XPS STUDIES OF CeO2/Nb2O5 INTERFACE EFFECT ON THE IMPROVEMENT OF THE OXYGEN SENSITIVITY OF CeO2 LAYER

DU XIN-HUA, LIU ZHEN-XIANG, XIE KAN, WANG YAN-BIN, CHU WU-YANG
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  • 用射频/直流磁控溅射法制备了CeO2/Nb2O5双层氧敏薄膜,利用X射线光电子能谱(XPS),描述并解释了单层CeO2薄膜中氧随温度变化的动力学行为,以及CeO2/Nb2O5薄膜界面对氧敏特性的影响.通过对Ce3d XPS谱的高斯拟合,计算了Ce3+浓度并给出了判定Ce4+还原的标志.结果表明,界面效应可以提高CeO2/Nb2O5薄膜中Ce4+的还原能力,使之远远高于单层CeO2薄膜,这对薄膜的氧敏特性是极为有利的.
    The CeO2 single layer and CeO2/Nb2O5 double-layer films have been deposited on a Al2O3 ceramic substrates by a reactive rf/dc sputtering magnetron system. The variation of kinetic behavior of oxygen in CeO2 single layer with temperatures, and also the influence of CeO2/Nb2O5 interface on oxygen sensitivity of the films have been studied by XPS. X-ray photoelectron spectra of Ce3d core level were deconvoluted by Gaussian function for calculating the different concentration of Ce3+ and Ce4+ in the films. The results have shown that the CeO2/Nb2O5 double-layer could improve reduction capability of Ce4+ easily due to the interface effect, so that the reduction capability is higher in CeO2/Nb2O5 double-layer than they were in CeO2 single layer.
    • 基金项目: 福特-中国发展研究基金(批准号:09415106)资助的课题.
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  • 文章访问数:  6118
  • PDF下载量:  946
  • 被引次数: 0
出版历程
  • 收稿日期:  1998-04-22
  • 修回日期:  1998-06-03
  • 刊出日期:  1998-06-05

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