-
用捕获膜技术和卢瑟福背散射(RBS)分析,测定Al-Sn多相合金在30keV Ar+离子轰击时Al和Sn的溅射原子角分布。溅射后的样品用扫描电子显微镜(SEM)进行观察,并用电子微探针分析仪(EPMA)对轰击样品(靶点)和未轰击样品作成分分析。结果表明,Al的溅射原子角分布近于cosine形状,而Sn却是over-cosine型角分布。本文给出一个按不同表面形貌特征划分的各元素富集区i进行叠加的产额表达式,Y(θ)=∑Yi(θ),解释了实验结果。The angular distributions of sputtered Al and Sn atoms ejected from the Al-Sn multi phase alloy bombarded by 30keV Ar+ ion have been measured with collector technique and RBS analysis. The sputtered surface has been observed with scanning electron microscopy (SEM), and its compositions have been analyzed both in sputtered and unsputtered areas with electron x-ray probe microanalyser (EPMA). The results show that the angular distribution of sputtered Al atoms is nearly cosine, and that of Sn is over-cosine. To explain the experimental results we propose a reasonablt sputtering yield equation, Y(θ) = ∑Yi(θ) each , Yi(θ) stands for the sputtering yield of the area in which its surface topography and compositions is different from other areas.
计量
- 文章访问数: 5811
- PDF下载量: 602
- 被引次数: 0