基于克尔效应的真空绝缘子表面电场在线测量

刘微粒; 邹晓兵; 付洋洋; 王鹏; 王新新

doi:10.7498/aps.63.095207

摘要

克尔效应（Kerr Effect）作为一种电光效应，主要表现为：克尔介质在外加电场作用下，会使得入射到其中的探测光带有外加电场的信息. 基于上述原理，设计并搭建了由快脉冲高电压源、YAG激光器、同步控制子系统、被测绝缘子及克尔效应单元、相位差检测子系统构成的真空绝缘子表面电场在线测量实验平台. 通过对比性测量，观察到了真空绝缘子沿面带电导致的表面电场畸变现象. 并进一步对绝缘子表面电场的畸变进行了时间分辨测量.

关键词:

Abstract

Kerr effect is defined as an electro-optical physical phenomenon, in which the testing laser can change its polarization state as passing through a Kerr medium stressed by applied field. In this work, an on-line measurement system based on Kerr effect is established to investigate the surface electric field of insulator stressed by nanosecond HV pulse in vacuum which include a HV pulse source, YAG laser, synchronous controlling apparatus, Kerr cell & insulator sample, optical phase shift detecting subsystem. According to comparison experiments, the distortion of insulator surface electric field caused by surface charging is observed. And a time-resolution measurement on this field distortion is also performed.

Keywords:

作者及机构信息

1.
清华大学电机系, 电力系统国家重点实验室, 北京 100084

基金项目: 国家自然科学基金（批准号：51107064）和教育部博士点基金（批准号：20100002120007）资助的课题.

Authors and contacts

1.
State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing 100084, China

Funds: Project supported by the National Natural Science Foundation of China (Grant No. 51107064), and the Doctoral Fund of Ministry of Education of China (Grant No. 20100002120007).

参考文献

[1]	Miller H C 1989 IEEE Trans. Electrical Insulation 24 765
[2]	Stern J E, Mercy K R 1971 IEEE Trans. Electrical Insulation EI-6 90
[3]	Vlieks A E, Allen M A, Callin R S, Fowkes W R, Hoyt E W, Lebacqz J V, Lee T G 1989 IEEE Trans. Electrical Insulation 24 1023
[4]	Wetzer J M 1997 IEEE Trans. Dielectrics and Electrical Insulation 4 349
[5]	Li S T, Huang Q F, Sun J, Zhang T, Li J Y 2010 Acta Phys. Sin. 59 422 (in Chinese) [李盛涛, 黄奇峰, 孙健, 张拓, 李建英 2010 物理学报 59 422]
[6]	Zhang G J, Zhao W B, Zheng N, Yu K K, Ma X P, Yan Z 2007 High Voltage Engineering 33 30 (in Chinese) [张冠军, 赵文彬, 郑楠, 于开坤, 马新沛, 严璋2007 高电压技术 33 30]
[7]	Anderson R A 1974 Appl. Phys. Lett. 24 54
[8]	Blaise G, Gressus C L 1991 J. Appl. Phys. 69 6334
[9]	Tumiran, Maeyama M, Imada H, Kobayashi S, Saito Y 1997 IEEE Trans. Dielectrics and Electrical Insulation 4 400
[10]	Chalmers I D, Lei J H, Yang B, Siew W H 1995 IEEE Trans. Dielectrics and Electrical Insulation 2 225
[11]	Faircloth D C, Allen N L 2003 IEEE Trans. Dielectrics and Electrical Insulation 10 285
[12]	Sone M, Toriyama K, Toriyama Y 1974 Appl. Phys. Lett. 24 115
[13]	Zahn M 1994 IEEE Trans. Electrical Insulation 1 235
[14]	Zhu H L, Liu W L, Zou X B, Wang X X 2011 High Voltage Engineering 37 717 (in Chinse) [朱宏林, 刘微粒, 邹晓兵, 王新新 2011高电压技术 37 717]

施引文献

[1]	Miller H C 1989 IEEE Trans. Electrical Insulation 24 765
[2]	Stern J E, Mercy K R 1971 IEEE Trans. Electrical Insulation EI-6 90
[3]	Vlieks A E, Allen M A, Callin R S, Fowkes W R, Hoyt E W, Lebacqz J V, Lee T G 1989 IEEE Trans. Electrical Insulation 24 1023
[4]	Wetzer J M 1997 IEEE Trans. Dielectrics and Electrical Insulation 4 349
[5]	Li S T, Huang Q F, Sun J, Zhang T, Li J Y 2010 Acta Phys. Sin. 59 422 (in Chinese) [李盛涛, 黄奇峰, 孙健, 张拓, 李建英 2010 物理学报 59 422]
[6]	Zhang G J, Zhao W B, Zheng N, Yu K K, Ma X P, Yan Z 2007 High Voltage Engineering 33 30 (in Chinese) [张冠军, 赵文彬, 郑楠, 于开坤, 马新沛, 严璋2007 高电压技术 33 30]
[7]	Anderson R A 1974 Appl. Phys. Lett. 24 54
[8]	Blaise G, Gressus C L 1991 J. Appl. Phys. 69 6334
[9]	Tumiran, Maeyama M, Imada H, Kobayashi S, Saito Y 1997 IEEE Trans. Dielectrics and Electrical Insulation 4 400
[10]	Chalmers I D, Lei J H, Yang B, Siew W H 1995 IEEE Trans. Dielectrics and Electrical Insulation 2 225
[11]	Faircloth D C, Allen N L 2003 IEEE Trans. Dielectrics and Electrical Insulation 10 285
[12]	Sone M, Toriyama K, Toriyama Y 1974 Appl. Phys. Lett. 24 115
[13]	Zahn M 1994 IEEE Trans. Electrical Insulation 1 235
[14]	Zhu H L, Liu W L, Zou X B, Wang X X 2011 High Voltage Engineering 37 717 (in Chinse) [朱宏林, 刘微粒, 邹晓兵, 王新新 2011高电压技术 37 717]

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