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AUGER DEPTH PROFILE ANALYSIS OF GexSi1-x/Si SUPERLATTICE

WEI XING JIANG WEI-DONG ZHOU GUO-LIANG YU MING-REN WANC XUN

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AUGER DEPTH PROFILE ANALYSIS OF GexSi1-x/Si SUPERLATTICE

WEI XING, JIANG WEI-DONG, ZHOU GUO-LIANG, YU MING-REN, WANC XUN
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  • Received Date:  31 October 1990
  • Published Online:  28 June 2005

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