| [1] |
Li Jun, Chen Xiao-Hui, Wu Qiang, Luo Bin-Qiang, Li Mu, Yang Qing-Guo, Tao Tian-Jiong, Jin Ke, Geng Hua-Yun, Tan Ye, Xue Tao. Experimental investigation on dynamic lattice response by in-situ Xray diffraction method. Acta Physica Sinica,
2017, 66(13): 136101.
doi: 10.7498/aps.66.136101
|
| [2] |
Sun Yun, Wang Sheng-Lai, Gu Qing-Tian, Xu Xin-Guang, Ding Jian-Xu, Liu Wen-Jie, Liu Guang-Xia, Zhu Sheng-Jun. Study of KDP crystal lattice strain and stress by high resolution X-ray diffraction. Acta Physica Sinica,
2012, 61(21): 210203.
doi: 10.7498/aps.61.210203
|
| [3] |
Tan Guo-Tai, Chen Zheng-Hao. XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica,
2007, 56(3): 1702-1706.
doi: 10.7498/aps.56.1702
|
| [4] |
Li Zhi-Hong, Sun Ji-Hong, Zhao Jun-Peng, Wu Dong, Sun Yu-Han, Liu Yi, Sheng Wen-Jun, Dong Bao-Zhong. . Acta Physica Sinica,
2000, 49(4): 775-780.
doi: 10.7498/aps.49.775
|
| [5] |
YU MIN-FENG, YANG YU, SHEN WEN-ZHONG, ZHU HAI-JUN, GONG DA-WEI, SHENG CHI, WANG XUN. INTERSUBBAND ABSORPTION IN p-TYPE GexSi1-x/Si MULTIPLE QUANTUM WELLS AND ITS ANALYSIS. Acta Physica Sinica,
1997, 46(4): 740-746.
doi: 10.7498/aps.46.740
|
| [6] |
WANG YU-TIAN, ZHUANG YAN, JIANG DE-SHENG, YANG XIAO-PING, JIANG XIAO-MING, WU JIA-YANG, XIU LI-SONG, ZHENG WEN-LI. STUDY OF DOUBLE-BARRIER SUPERLATTICE BY SYNCHROTRON RADIATION AND DOUBLE-CRYSTAL X-RAY DIFFRACTION. Acta Physica Sinica,
1996, 45(10): 1709-1716.
doi: 10.7498/aps.45.1709
|
| [7] |
XU ZHI-ZHONG. THE VALENCE BAND STRUCTURES AND OPTICAL PROPERTIES OF STRAINED GaAs LAYERS GROWN ON THE GexSi1-x(001) SUBSTRATES. Acta Physica Sinica,
1996, 45(1): 126-132.
doi: 10.7498/aps.45.126
|
| [8] |
GUI QIAN, HUANG QI, CHEN HONG, ZHOU JUN-MING. Si AND GexSi1-x GROWTH MODE STUDY BY RHEED ON H-TERMINATED VICINAL Si SUBSTRATE. Acta Physica Sinica,
1996, 45(4): 647-654.
doi: 10.7498/aps.45.647
|
| [9] |
Xu Zhi-Zhong. . Acta Physica Sinica,
1995, 44(7): 1141-1147.
doi: 10.7498/aps.44.1141
|
| [10] |
HAO JIAN-MIN, CHEN JI-ZHOU, ZHANG SHI-MIN. INFLUENCE OF DIFFERENT COHERENT DOMAIN SIZES ASSOCIATED WITH SUBLATTICES ON XRD INTE-GRATED WIDTH AND INTEGRATED INTENSITY. Acta Physica Sinica,
1994, 43(5): 772-778.
doi: 10.7498/aps.43.772
|
| [11] |
XU ZHI-ZHONG. THE BOND LENGTHS AND THEIR EFFECTS ON THE ELECTRONIC ENERGY BAND STRUCTURES IN THE GexSi1-x ALLOYS. Acta Physica Sinica,
1994, 43(7): 1111-1117.
doi: 10.7498/aps.43.1111
|
| [12] |
HE XIAN-CHANG, WU ZI-QIN, ZHAO TE-XIU, Lü ZHI-HUI, WANG XIAO-PING, SUN GUO-XI. INVESTIGATION OF LATTICE DEFORMATION OF POROUS SILICON FILMS BY X-RAY DOUBLE CRYSTAL DIFFRACTION. Acta Physica Sinica,
1993, 42(6): 954-962.
doi: 10.7498/aps.42.954
|
| [13] |
LI JIAN-HUA, MAI ZHEN-HONG, CUI SHU-FAN. X-RAY DOUBLE-CRYSTAL DIFFRACTION AND TOPOGRAPHY STUDY OF STRAIN RELAXED InGaAs/GaAs SUPERLATTICES. Acta Physica Sinica,
1993, 42(9): 1485-1490.
doi: 10.7498/aps.42.1485
|
| [14] |
XU ZHI-ZHONG. OPTICAL PROPERTIES OF COHERENTLY STRAINED ALLOYS GexSi1-x ON Si (001) SUBSTRATES. Acta Physica Sinica,
1993, 42(5): 824-831.
doi: 10.7498/aps.42.824
|
| [15] |
ZHOU GUO-LIANG, SHENG CHI, FAN YONG-LIANG, JIANG WEI-DONG, YU MING-RBN. MOLECULAR BEAM EPITAXY GROWTH AND CHARACTERI-ZATION OF GexSi1-x/Si STRAINED-LAYER SUPERLATTICES. Acta Physica Sinica,
1993, 42(7): 1121-1128.
doi: 10.7498/aps.42.1121-2
|
| [16] |
Zhou Guo-liang Sheng Chi Fan Yong-liang Jiang Wei-dong Yu Ming-reng. MOLECULAR BEAM EPITAXY GROWTH AND CHARACTERIZATION OF Ge_xSi_1-x_/Si STRAINED一AYER SUPERLATTICES. Acta Physica Sinica,
1991, 40(7): 1121-1128.
doi: 10.7498/aps.40.1121
|
| [17] |
ZHU NAN-CHANG, LI RUN-SHEN, XU SHUN-SHENG. INVESTIGATION OF THE SEMICONDUCTOR STRAINED SUPERLATTICE STRUCTURE AND INTERFACE BY X-RAY ROCKING-CURVE ANALYSIS. Acta Physica Sinica,
1991, 40(3): 433-440.
doi: 10.7498/aps.40.433
|
| [18] |
WEI XING, JIANG WEI-DONG, ZHOU GUO-LIANG, YU MING-REN, WANC XUN. AUGER DEPTH PROFILE ANALYSIS OF GexSi1-x/Si SUPERLATTICE. Acta Physica Sinica,
1991, 40(9): 1514-1519.
doi: 10.7498/aps.40.1514
|
| [19] |
TIAN LIANG-GUANG, ZHU NAN-CHANG, CHEN JING-YI, LI RUN-SHEN, XU SHUN-SHENG, ZHOU GUO-LIANG. X-RAY DOUBLE-CRYSTAL DIFFRACTION STUDY OF HIGH QUALITY GexSi1-x/Si STRAINED LAYER SUPERLATTICE. Acta Physica Sinica,
1991, 40(3): 441-448.
doi: 10.7498/aps.40.441
|
| [20] |
MA DE-LU, SHANG DE-YING, YU JIN-HUA. XRD STUDY OF N2+ IMPLANTED Si. Acta Physica Sinica,
1989, 38(4): 579-585.
doi: 10.7498/aps.38.579
|
下载:
