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EFFECT OF BF+2 IMPLANTED IN HARDENED Si-GATE PMOSFET

ZHANG TING-QING LIU JIA-LU LI JIAN-JUN WANG JIAN-PING ZHANG ZHENG-XUAN XU NA-JUN ZHAO YUAN-FU HU YU-HONG

Citation:

EFFECT OF BF+2 IMPLANTED IN HARDENED Si-GATE PMOSFET

ZHANG TING-QING, LIU JIA-LU, LI JIAN-JUN, WANG JIAN-PING, ZHANG ZHENG-XUAN, XU NA-JUN, ZHAO YUAN-FU, HU YU-HONG
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  • Abstract views:  6229
  • PDF Downloads:  612
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Publishing process
  • Received Date:  02 February 1999
  • Accepted Date:  20 March 1999
  • Published Online:  05 June 1999

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