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Investigation of stable high-index silicon surfacesby means of LEED pattern analysis

Jiang Jin-Long Li Wen-Jie Zhou Li Zhao Ru-Guang Yang Wei-Sheng

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Investigation of stable high-index silicon surfacesby means of LEED pattern analysis

Jiang Jin-Long, Li Wen-Jie, Zhou Li, Zhao Ru-Guang, Yang Wei-Sheng
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  • Abstract views:  7962
  • PDF Downloads:  559
  • Cited By: 0
Publishing process
  • Received Date:  13 May 2002
  • Accepted Date:  12 June 2002
  • Published Online:  03 April 2005

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