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In-situ monitoring of the growth of oxide thin films in PLD using high-pressure reflection high energy electron diffraction

Chen Ying-Fei Peng Wei Li Jie Chen Ke Zhu Xiao-Hong Wang Ping Zeng Guang Zheng Dong-Ning Li Lin

Citation:

In-situ monitoring of the growth of oxide thin films in PLD using high-pressure reflection high energy electron diffraction

Chen Ying-Fei, Peng Wei, Li Jie, Chen Ke, Zhu Xiao-Hong, Wang Ping, Zeng Guang, Zheng Dong-Ning, Li Lin
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  • Abstract views:  7113
  • PDF Downloads:  817
  • Cited By: 0
Publishing process
  • Received Date:  06 June 2003
  • Accepted Date:  13 June 2003
  • Published Online:  05 May 2003

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