Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

3UCVD deposition SiO2 on SiC wafer and its C-V measurement

Tang Xiao-Yan Zhang Yi-Men Zhang He-Ming Zhang Yu-Ming Dai Xian-Ying Hu Hui-Yong

Citation:

3UCVD deposition SiO2 on SiC wafer and its C-V measurement

Tang Xiao-Yan, Zhang Yi-Men, Zhang He-Ming, Zhang Yu-Ming, Dai Xian-Ying, Hu Hui-Yong
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

Metrics
  • Abstract views:  6840
  • PDF Downloads:  751
  • Cited By: 0
Publishing process
  • Received Date:  28 July 2003
  • Accepted Date:  06 February 2004
  • Published Online:  16 September 2004

/

返回文章
返回