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Oxidation-induced stacking faults in nitrogen-doped czochralski silicon investigated by transmission electron microscope

Xu Jin Yang De-Ren Chu Jia Ma Xiang-Yang Que Duan-Lin

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Oxidation-induced stacking faults in nitrogen-doped czochralski silicon investigated by transmission electron microscope

Xu Jin, Yang De-Ren, Chu Jia, Ma Xiang-Yang, Que Duan-Lin
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  • Abstract views:  6425
  • PDF Downloads:  777
  • Cited By: 0
Publishing process
  • Received Date:  13 December 2002
  • Accepted Date:  11 April 2003
  • Published Online:  05 January 2004

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