Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

Secondary ion mass spectroscopic depth profile analysis of oxygen contamination in hydrogenated microcrystalline silicon

Zhang Xiao-Dan Zhao Ying Zhu Feng Wei Chang-Chun Mai Yao-Hua Gao Yan-Tao Sun Jian Geng Xin-Hua Xiong Shao-Zhen

Citation:

Secondary ion mass spectroscopic depth profile analysis of oxygen contamination in hydrogenated microcrystalline silicon

Zhang Xiao-Dan, Zhao Ying, Zhu Feng, Wei Chang-Chun, Mai Yao-Hua, Gao Yan-Tao, Sun Jian, Geng Xin-Hua, Xiong Shao-Zhen
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

Metrics
  • Abstract views:  6460
  • PDF Downloads:  758
  • Cited By: 0
Publishing process
  • Received Date:  15 July 2004
  • Accepted Date:  03 November 2004
  • Published Online:  05 February 2005

/

返回文章
返回