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Microstructure induced by stress generated by high-current pulsed electron beam

Guan Qing-Feng An Chun-Xiang Qin Ying Zou Jian-Xin Hao Sheng-Zhi Zhang Qing-Yu Dong Chuang Zou Guang-Tian

Citation:

Microstructure induced by stress generated by high-current pulsed electron beam

Guan Qing-Feng, An Chun-Xiang, Qin Ying, Zou Jian-Xin, Hao Sheng-Zhi, Zhang Qing-Yu, Dong Chuang, Zou Guang-Tian
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  • Abstract views:  6800
  • PDF Downloads:  790
  • Cited By: 0
Publishing process
  • Received Date:  22 October 2004
  • Accepted Date:  12 January 2005
  • Published Online:  05 April 2005

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