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Generation mechanism of stress induced leakage current in flash memory cell

Liu Hong-Xia Zheng Xue-Feng Hao Yue

Citation:

Generation mechanism of stress induced leakage current in flash memory cell

Liu Hong-Xia, Zheng Xue-Feng, Hao Yue
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  • Abstract views:  8871
  • PDF Downloads:  1535
  • Cited By: 0
Publishing process
  • Received Date:  08 April 2005
  • Accepted Date:  18 July 2005
  • Published Online:  05 June 2005

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