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Xu Si-Wei, Wang Xun-Si, Shen Xiang. Structure of GexGa8S92–x glasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scattering. Acta Physica Sinica,
2023, 72(1): 017101.
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Bao Dong, Hua Deng-Xin, Qi Hao, Wang Jun. Method of remotely sensing seawater salinity fine detection based on Raman Brillouin scattering. Acta Physica Sinica,
2021, 70(22): 229201.
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Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao. Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica,
2018, 67(19): 197203.
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Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De. Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica,
2013, 62(4): 048801.
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Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong. Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica,
2013, 62(14): 140701.
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Su Yuan-Jun, Xu Jun, Zhu Ming, Fan Peng-Hui, Dong Chuang. Hydrogenated poly-crystalline silicon thin films deposited by inductively coupled plasma assisted pulsed dc twin magnetron sputtering. Acta Physica Sinica,
2012, 61(2): 028104.
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Zhong Wen-Wu, Liu Fa-Min, Cai Lu-Gang, Ding Peng, Liu Xue-Quan, Li Yi. Effects of codoping of Al and Sb on structure and optical properties of ZnO nanorod ordered array thin films. Acta Physica Sinica,
2011, 60(11): 118102.
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Xu Xiao-Ming, Miao Wei, Tao Kun. Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica,
2011, 60(8): 086101.
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica,
2009, 58(4): 2742-2745.
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Zhao Jian-Hua, Chen Bo, Wang De-Liang. Anharmonic phonon coupling and phonon confinement in nanocrystalline anatase TiO2. Acta Physica Sinica,
2008, 57(5): 3077-3084.
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng. Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica,
2008, 57(11): 7119-7125.
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. Properties of Co nano-films deposited on monocrystalline silicon surface by ion beam sputtering. Acta Physica Sinica,
2007, 56(12): 7158-7164.
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Yu Quan-Zhi, Li Yu-Tong, Jiang Xiao-Hua, Liu Yong-Gang, Wang Zhe-Bin, Dong Quan-Li, Liu Feng, Zhang Zhe, Huang Li-Zhen, C. Danson, D. Pepler, Ding Yong-Kun, Fu Shi-Nian, Zhang Jie. Infulence of electron temperature on the two peaks of Thomson scattering ion-acoustic waves in laser plasmas. Acta Physica Sinica,
2007, 56(1): 359-365.
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Chen Yong-Sheng, Gao Xiao-Yong, Yang Shi-E, Lu Jing-Xiao, Gu Jin-Hua. The influence of deposition temperature on the structure of microcrystalline silicon film. Acta Physica Sinica,
2007, 56(7): 4122-4126.
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Wang Rui-Min, Chen Guang-De, Zhu You-Zhang. Micro-Raman scattering study of hexagonal InGaN epitaxial layer. Acta Physica Sinica,
2006, 55(2): 914-919.
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Cao Chun-Fang, Wu Hui-Zhen, Si Jian-Xiao, Xu Tian-Ning, Chen Jing, Shen Wen-Zhong. Abnormal Raman spectra of PbTe crystalline thin films grown by molecular beam epitaxy. Acta Physica Sinica,
2006, 55(4): 2021-2026.
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Wu Yan-Zhao, Yu Ping, Wang Yu-Fang, Jin Qing-Hua, Ding Da-Tong, Lan Guo-Xiang. Baman scattering intensity of single-wall carbon nanotubes. Acta Physica Sinica,
2005, 54(11): 5262-5268.
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Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma. X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica,
2004, 53(10): 3510-3514.
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Yang Hui-Dong, Wu Chun-Ｙa, Zhao Ying, Xue Jun-Ｍing, Geng Xin-Ｈua, Xiong Shao-Ｚhen. Investigation on the oxygen contamination in the μc-Si∶H thin film deposited b y VHF-PECVD. Acta Physica Sinica,
2003, 52(11): 2865-2869.
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Zhang Ji-Cai, Dai Lun, Qin Guo-Gang, Ying Li-Zhen, Zhao Xin-Sheng. . Acta Physica Sinica,
2002, 51(3): 629-634.
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