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Measurement of thickness and refractive index of Zn1-xMgxO film grown on sapphire substrate by molecular beam epitaxy

Yan Feng-Ping Zheng Kai Wang Lin Li Yi-Fan Gong Tao-Rong Jian Shui-Sheng K. Ogata K. Koike S. Sasa M. Inoue M. Yano

Citation:

Measurement of thickness and refractive index of Zn1-xMgxO film grown on sapphire substrate by molecular beam epitaxy

Yan Feng-Ping, Zheng Kai, Wang Lin, Li Yi-Fan, Gong Tao-Rong, Jian Shui-Sheng, K. Ogata, K. Koike, S. Sasa, M. Inoue, M. Yano
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  • Abstract views:  7162
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Publishing process
  • Received Date:  27 September 2006
  • Accepted Date:  21 November 2006
  • Published Online:  20 July 2007

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