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The electron emission yield induced by the interaction of highly charged argon ions with silicon surface

Zhao Yong-Tao Xiao Guo-Qing Xu Zhong-Feng Abdul Qayyum Wang Yu-Yu Zhang Xiao-An Li Fu-Li Zhan Wen-Long

Citation:

The electron emission yield induced by the interaction of highly charged argon ions with silicon surface

Zhao Yong-Tao, Xiao Guo-Qing, Xu Zhong-Feng, Abdul Qayyum, Wang Yu-Yu, Zhang Xiao-An, Li Fu-Li, Zhan Wen-Long
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  • Abstract views:  8316
  • PDF Downloads:  1209
  • Cited By: 0
Publishing process
  • Received Date:  10 January 2007
  • Accepted Date:  09 February 2007
  • Published Online:  05 May 2007

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